Drain/Gate-Voltage-Dependent On-Current and Off-Current Instabilities in Polycrystalline Silicon Thin-Film Transistors under Electrical Stress
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概要
- 論文の詳細を見る
The On-current ($I_{\text{on}}$) and Off-current ($I_{\text{off}}$) instabilities of polycrystalline silicon thin-film transistors (poly-Si TFTs) were investigated under various stress conditions. The stress-induced device degradation was studied by measuring the dependences of $I_{\text{on}}$ and $I_{\text{off}}$ on the drain/gate voltages. From the results, dissimilar variations in $I_{\text{on}}$ and $I_{\text{off}}$ were observed. The differences can be attributed to the variances in the amount of trap charges in the gate oxide and the spatial distributions of the trap states generated in the poly-Si channel. A comprehensive model for the degradation of $I_{\text{on}}$ and $I_{\text{off}}$ in poly-Si TFTs under various electrical stress conditions was suggested.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-09-15
著者
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Lo Wei
Department Of Physics And Centre For Computational Science And Engineering National University Of Si
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Lei Tan
Department Of Electronic Engineering National Chiao Tung University
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Chang Tzu
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Wang Shen
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Rd., Hsin-Chu 300, Taiwan, R.O.C.
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Lei Tan
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Rd., Hsin-Chu 300, Taiwan, R.O.C.
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Sang Jen
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Rd., Hsin-Chu 300, Taiwan, R.O.C.
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Lo Wei
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Rd., Hsin-Chu 300, Taiwan, R.O.C.
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WANG Shen
Department of Computer Science and Technology, Harbin Institute of Technology
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Chang Tzu
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Rd., Hsin-Chu 300, Taiwan, R.O.C.
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