Emission Light and Multiple Surface Plasmon Excitations at Prism/Ag/Merocyanine Langmuir-Blodgett Films
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概要
- 論文の詳細を見る
Emission light through a prism has been investigated for prism/silver (Ag) thin film/merocyanine (MC) Langmuir-Blodgett (LB) films in the Kretschmann configuration. Emission light was observed by means of direct irradiation of a laser beam from air to the MC LB films, that is, reverse irradiation. The emission properties coincided with resonant conditions of surface plasmon (SP) excitations in the Kretschmann configuration. Emission due to SP excitations depended upon the position of the MC LB film in the LB hetero films of arachidic acid (C20)/MC/C20 on the Ag thin film. The strongest emission was observed at some separation of the MC LB layer from the metal surface. Emission properties were also investigated for the hetero LB films of MC and C20 on aluminum (Al) thin film and for the MC LB films with various thicknesses. It is thought that the phenomenon is useful for application to new devices utilizing multiple SP excitations.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-04-15
著者
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TERAKADO Mitsuru
Department of Electrical and Electronic Engineering, Niigata University
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Tsuboi Nozomu
Department Of Electrical Engineering Nagaoka University Of Technology:(present Address)department Of
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Kaneko Futao
Department Of Electrical And Electronic Engineering Faculty Of Engineering Niigata University
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Kato Keizo
Department Of Electrical And Electronic Engineering
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Shinbo Kazunari
Department Of Electrical And Electronic Engineering Niigata University
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Wakamatsu Takashi
Department Of Electrical And Electronics System Engineering Ibaraki National College Of Technology
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Sato Toshiharu
Department Of Electrical And Electronic Engineering Niigata University
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Nakano Takayuki
Department Of Biosciences Teikyo University
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Advincula Rigoberto
Department Of Chemistry University Of Alahama At Birmingham
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Kato Keizo
Department of Electrical and Electronic Engineering, Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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Kaneko Futao
Department of Electrical and Electronic Engineering, Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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Kato Keizo
Department of Electrical and Electronic Eng., Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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Kaneko Futao
Department of Electrical and Electronic Eng., Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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Shinbo Kazunari
Department of Electrical and Electronic Engineering, Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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Shinbo Kazunari
Department of Electrical and Electronic Eng., Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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Terakado Mitsuru
Department of Electrical and Electronic Engineering, Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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Advincula Rigoberto
Department of Chemistry, University of Houston, 4800 Calhoun Rd., Houston, Texas 77204, USA
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Wakamatsu Takashi
Department of Electrical Engineering, Ibaraki National College of Technology, Nakane 866, Hitachinaka 312-8508, Japan
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Sato Toshiharu
Department of Electrical and Electronic Engineering, Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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Nakano Takayuki
Department of Electrical and Electronic Engineering, Niigata University, Ikarashi 2-8050, Niigata 950-2181, Japan
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