Penetration-Depth Characteristics of Evanescent Fields at Metal Attenuated Total Reflection
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概要
- 論文の詳細を見る
Evanescent waves generated on a metal surface at attenuated total reflection (ATR) were detected with a fluorescent-dye-coated probe tip. The field intensity of the metal ATR evanescent waves is considerably larger than that of total internal reflection (TIR) evanescent fields on a dielectric surface, but the ATR-field penetration depth depends only upon the incident angle of excitation light at a fixed wavelength; at the same incident angle, it is nearly the same value as that of the TIR fields.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-06-15
著者
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Wakamatsu Takashi
Department Of Electrical And Electronics System Engineering Ibaraki National College Of Technology
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Aizawa Kento
Department of Electrical and Electronics System Engineering, Ibaraki National College of Technology, 866 Nakane, Hitachinaka-shi, Ibaraki 312-8508, Japan
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Wakamatsu Takashi
Department of Electrical and Electronics System Engineering, Ibaraki National College of Technology, 866 Nakane, Hitachinaka-shi, Ibaraki 312-8508, Japan
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