X-Ray Photoelectron Spectroscopy Study of Synchrotron Radiation Irradiation of a Polytetrafluoroethylene Surface
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概要
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The effect of synchrotron radiation (SR) irradiation of a polytetrafluoroethylene (PTFE) surface was investigated using X-ray photoelectron spectroscopy (XPS). After the SR irradiation, the relative intensity of the F $1s$ peak to the C $1s$ peak decreased markedly. The chemical composition ratio of the F atoms to C atoms was estimated to be 0.29. From the curve fitting analysis of C $1s$ and F $1s$ XPS spectra, the chemical components and their intensity ratio were determined. The reason for the chemical composition change by the SR irradiation was discussed.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2003-04-15
著者
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Kanda Kazuhiro
Graduate School Of Science And Laboratory Of Advanced Science And Technology For Industry Himeji Ins
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Haruyama Yuichi
Graduate School Of Science And Laboratory Of Advanced Science And Technology For Industry Himeji Ins
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ISHIGAKI Hiroyuki
Graduate School of Engineering, Himeji Institute of Technology
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Ideta Tomoya
Graduate School Of Engineering Himeji Institute Of Technology
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Matsui Shinji
Graduate School Of Science And Laboratory Of Advanced Science And Technology For Industry Himeji Ins
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Ideta Tomoya
Graduate School of Engineering, Himeji Institute of Technology, 2167 Syosya, Himeji, Hyogo 671-2201, Japan
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