Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS) as a New Tool for Solid Surface Characterization

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概要

• 論文の詳細を見る
• 日本学士院の論文

著者

• Koshizaki Naoto

  Institute Of Industrial Science University Of Tokyo

• Kamada Hitoshi

  Faculty Of Engineering Yamagata University

• Nihei Yoshimasa

  Institute Of Industrial Science The University Of Tokyo

• Kudo Masahiro

  Institute Of Industrial Science University Of Tokyo

• Owari Masanori

  Institute Of Industrial Science University Of Tokyo

• KOSHIZAKI Naoto

  Institute of Industrial Science, University of Tokyo

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