Site-Specific Characteristic of the Kikuch-Like Bands in High-Angular-Resolution X-Ray Photoelectron Diffraction

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1996-05-01

著者

• NIHEI Yoshimasa

  Institute of Industrial Science, University of Tokyo

• Ishii Hideshi

  Institute Of Industrial Science The University Of Tokyo

• ICHINOHE Yuji

  Institute of Industrial Science, The University of Tokyo

• OWARI Masanori

  Environmental Science Center, The University of Tokyo

• Nihei Yoshimasa

  Institute Of Industrial Science The University Of Tokyo

• Ichinohe Yuji

  Institute Of Industrial Science The University Of Tokyo

• Owari Masanori

  Environmental Science Center The University Of Tokyo

関連論文

• Structural and Chemical State Analysis of the Heat-Treated Au/GaSb(110) Interface by Means of Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS)
• Site-Specific Characteristic of the Kikuch-Like Bands in High-Angular-Resolution X-Ray Photoelectron Diffraction
• Supercritical Fluid Clean-Up of Environmental Samples for the Analysis of Polycyclic Aromatic Hydrocarbons Using Time-of-Flight Secondary Ion Mass Spectrometry
• Numerical Simulation of X-Ray Fluorescence Holography from Ge(001) : Condensed Matter: Structure, etc.
• Site-Specific Extinction Rule for Kikuchi Bands in X-ray Photoelectron Diffraction
• Theoretical Studies of Element-Specific Kikuchi-Band Effects in X-Ray Photoelectron Diffraction
• Development of a Supercritical Fluid Extractor Coupled with a Time-of-Flight Mass Spectrometer for Online Detection of Extracts
• Estimation of Low-Energy Ion Bombardment Damage on GaAs(001) Surface by X-Ray Photoelectron Diffraction
• Experimental and Theoretical Two-Dimensional X-Ray Photoelectron Diffraction Patterns from GaAs(001) Surface
• Direct Atomic Site Determination of Foreign Atoms in a Crystal Surface Layer by X-Ray Photoelectron Diffraction
• Estimation of Surface Crystal Regularity by Utilizing X-Ray Photoelectron Diffraction (XPED) Effects
• Quantitative XPS Measurement on the Surfaces of GaP, GaSb and ZnSe Single Crystals
• Quantitative X-Ray Photoelectron Spectroscopic (XPS) Measurement on the Surfaces of GaAs(111), (111) and (110) Single Crystals : Determination of Relative Photo-Auger Ionization Cross Sections and Electron Mean Free Paths by Using the Crystal Regularity o
• Angular Denendence of XPS Intensities from GaAs (110) Surface : PHOTOEMISSION (MAINLY UPS AND XPS)
• Relative Sensitivity Factors for Subrmicrorn Secondary Jon Mass Spectrometry with Gallium Prirmary Ion Beam
• Development of an Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
• Behavior of Gallium Secondary Ion Intensity in Gallium Focused Ion Beam Secondary Ion Mass Spectrometry
• A Chemical-State-Discriminated XPED Study on Structure of Thin CaO Layer Formed by Electron Bombardment Heating on CaF_2(111)
• X-ray photoelectron diffraction (XPED) studies on metal oxide surfaces. I. Analysis of the XPED patterns from TiO2(001) and .ALPHA.-Al2O3(0001) by the single scattering calculation.
• Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS) as a New Tool for Solid Surface Characterization
• Characterization of solid surfaces by means of combined electron spectroscopy (XPS-SEM-microAES).:XPS-SEM-MicroAES
• Behavior of Gallium Secondary Ion Intensity in Gallium Focused Ion Beam Secondary Ion Mass Spectrometry
• Structure of platinum particles deposited on titanium dioxide (110) surface studied by X-ray photoelectron diffraction.

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