Site-Specific Extinction Rule for Kikuchi Bands in X-ray Photoelectron Diffraction
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-12-15
著者
-
Ishii H
Institute Of Industrial Science University Of Tokyo
-
Omori Shinji
Institute Of Industrial Science University Of Tokyo
-
NIHEI Yoshimasa
Institute of Industrial Science, University of Tokyo
-
Ishii Hideshi
Institute Of Industrial Science The University Of Tokyo
-
Nihei Yoshimasa
Institute Of Industrial Science The University Of Tokyo
関連論文
- Structural and Chemical State Analysis of the Heat-Treated Au/GaSb(110) Interface by Means of Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS)
- Site-Specific Characteristic of the Kikuch-Like Bands in High-Angular-Resolution X-Ray Photoelectron Diffraction
- Numerical Simulation of X-Ray Fluorescence Holography from Ge(001) : Condensed Matter: Structure, etc.
- Site-Specific Extinction Rule for Kikuchi Bands in X-ray Photoelectron Diffraction
- Theoretical Studies of Element-Specific Kikuchi-Band Effects in X-Ray Photoelectron Diffraction
- Estimation of Low-Energy Ion Bombardment Damage on GaAs(001) Surface by X-Ray Photoelectron Diffraction
- Experimental and Theoretical Two-Dimensional X-Ray Photoelectron Diffraction Patterns from GaAs(001) Surface
- Direct Atomic Site Determination of Foreign Atoms in a Crystal Surface Layer by X-Ray Photoelectron Diffraction
- Estimation of Surface Crystal Regularity by Utilizing X-Ray Photoelectron Diffraction (XPED) Effects
- Quantitative XPS Measurement on the Surfaces of GaP, GaSb and ZnSe Single Crystals
- Quantitative X-Ray Photoelectron Spectroscopic (XPS) Measurement on the Surfaces of GaAs(111), (111) and (110) Single Crystals : Determination of Relative Photo-Auger Ionization Cross Sections and Electron Mean Free Paths by Using the Crystal Regularity o
- Angular Denendence of XPS Intensities from GaAs (110) Surface : PHOTOEMISSION (MAINLY UPS AND XPS)
- Relative Sensitivity Factors for Subrmicrorn Secondary Jon Mass Spectrometry with Gallium Prirmary Ion Beam
- Development of an Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
- Behavior of Gallium Secondary Ion Intensity in Gallium Focused Ion Beam Secondary Ion Mass Spectrometry
- A Chemical-State-Discriminated XPED Study on Structure of Thin CaO Layer Formed by Electron Bombardment Heating on CaF_2(111)
- X-ray photoelectron diffraction (XPED) studies on metal oxide surfaces. I. Analysis of the XPED patterns from TiO2(001) and .ALPHA.-Al2O3(0001) by the single scattering calculation.
- Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS) as a New Tool for Solid Surface Characterization
- Characterization of solid surfaces by means of combined electron spectroscopy (XPS-SEM-microAES).:XPS-SEM-MicroAES
- Behavior of Gallium Secondary Ion Intensity in Gallium Focused Ion Beam Secondary Ion Mass Spectrometry
- Structure of platinum particles deposited on titanium dioxide (110) surface studied by X-ray photoelectron diffraction.