On Per-Cell Dynamic IR-Drop Estimation in At-Speed Scan Testing
スポンサーリンク
概要
- 論文の詳細を見る
It is well known that dynamic IR-drop analysis consumes large amount of time even for a few clock cycles. This paper addresses this issue with a novel per-cell dynamic IR-drop estimation method. Instead of performing time-consuming IR-drop analysis for each clock cycle one by one, the proposed method uses global cycle average power profile for each cycle and dynamic IR-drop profiles for a few representative cycles, thus total computation time is effectively reduced. Experimental results on a benchmark circuit demonstrate that the proposed method achieves both high accuracy and high time-efficiency.
- 2012-06-15
著者
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Inoue Michiko
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Yoneda Tomokazu
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Inoue Michiko
Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST
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YAMATO Yuta
Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST
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HATAYAMA Kazumi
Nara Institute of Science and Technology
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HATAYAMA Kazumi
Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST
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YONEDA Tomokazu
Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST
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