Fault Tolerant Dynamic Reconfigurable Device Based on EDAC with Rollback(VLSI Architecture,<Special Section>VLSI Design and CAD Algorithms)

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概要

• 論文の詳細を見る

• Reconfigurable devices are expected to be utilized in such mission-critical fields as space development and undersea cables, because system updates and pseudo-repair can be achieved remotely by reconfiguring. However, conventional reconfigurable devices suffer from memory-bit upset caused by charged particles in space which results in fatal system problems. In this paper, we propose an architecture of a fault-tolerant reconfigurable device. The proposed device is divided into "autonomous-repair cells" with embedded control circuits. The autonomous-repair cell proposed in this paper is based on error detection and correction (EDAC) and uses hardware and time redundancy. From evaluation, it is shown that the proposed architecture achieves sufficient reliability against configuration memory upset. Trade-offs between performance and cost are also analyzed.

• 社団法人電子情報通信学会の論文
• 2006-12-01

著者

• OCHI HIROYUKI

  Department of Computer Engineering, Faculty of Information Sciences, Hiroshima City University

• Nakamura Yukihiro

  Department of Communications and Computers Engineering, Kyoto University

• NAKAHARA Kentaro

  Department of Applied Chemistry, Graduate School of Engineering, The University of Tokyo

• Ochi Hiroyuki

  Department Of Communications And Computer Engineering Graduate School Of Informatics Kyoto Universit

• NAKAMURA Yukihiro

  Research Organization of Science and Engineering, Ritsumeikan University

• IZUMI Tomonori

  Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto Univers

• Izumi Tomonori

  Department Of Vlsi System Design College Of Science And Engineering Ritsumeikan University

• Nakahara Kentaro

  Department Of Communications And Computer Engineering Graduate School Of Informatics Kyoto Universit

• Nakahara Kentaro

  Department Of Applied Chemistry Graduate School Of Engineering The University Of Tokyo

• Nakamura Yukihiro

  Research Organization Of Science And Engineering Ritsumeikan University

• Kouyama Shinichi

  Department Of Communications And Computer Engineering Graduate School Of Informatics Kyoto Universit

• NAKAMURA YUKIHIRO

  Department of Chemical Engineering, Faculty of Engineering Science, Osaka University

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