Application of Scanning Probe Microscope for Novel Characterization of Ferroelectric Capacitor
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-11-30
著者
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Heo J
Sungkyunkwan Univ. Kyunggi‐do Kor
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Yi Insook
Osaka Uoiversity
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Yi Insook
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
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Jang Daekyu
School Of Inforinarion And Communications Engineering Sungkyunkwan University
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Chung I
Microelectronics Laboratory Samsung Advanced Institute Of Technology
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Chung Ilsub
Material & Device Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Materials And Devices Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
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Chung Ilsub
School Of Information And Communication Engineering Sungkyunkwan University
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Chung Ilsub
School Of Information & Communications Engineering Sungkyunkwan University
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JANG Dongmin
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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HEO Jinhee
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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LEE Junekey
SFD laboratory Samsung Advanced Institute of Technology
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YASTAKE Masatoshi
Seiko Instruments
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Chung Ilsub
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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