Yi Insook | Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology

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概要

• Roh Yonghanの詳細を見る
• 同名の論文著者
• Microelectronics And Device Laboratory Samsung Advanced Institute Of Technologyの論文著者

関連著者

• Yi Insook

  Osaka Uoiversity

• Yi Insook

  Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology

• Chung I

  Microelectronics Laboratory Samsung Advanced Institute Of Technology

• Chung Ilsub

  Material & Device Lab Samsung Advanced Institute Of Technology

• Chung Ilsub

  Materials And Devices Lab Samsung Advanced Institute Of Technology

• Chung Ilsub

  Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology

• Heo J

  Sungkyunkwan Univ. Kyunggi‐do Kor

• CHUNG Ilsub

  Microelectronics Laboratory, Materials and Device Sector, Samsung Advanced Institute of Technology

• Jang Daekyu

  School Of Inforinarion And Communications Engineering Sungkyunkwan University

• Roh Yonghan

  School Of Electrical And Computer Engineering Sungkyunkwan University

• Chung Ilsub

  School Of Information And Communication Engineering Sungkyunkwan University

• Chung Ilsub

  School Of Information & Communications Engineering Sungkyunkwan University

• JANG Dongmin

  School of Info rolation and Communications Engineering, Sun gKyunKwan University

• HEO Jinhee

  School of Info rolation and Communications Engineering, Sun gKyunKwan University

• KIM DAEIK

  School of Electrical and Computer Engineering, Sungkyunkwan University

• Kim Daeik

  School Of Electrical And Computer Engineering Sungkyunkwan University

• Chung Ilsub

  School of Info rolation and Communications Engineering, Sun gKyunKwan University

• Roh Yonghan

  Microelectronics and Device Laboratory, Samsung Advanced Institute of Technology

• ROH Yonghan

  School of Information and Communication Engineering, Son gkyunkwan University

• LEE Junekey

  SFD laboratory Samsung Advanced Institute of Technology

• YASTAKE Masatoshi

  Seiko Instruments

• ROH YOUGHAN

  School of Electrical and Computer Engineering, Sungkyunkwan University

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著作論文

• Application of Scanning Probe Microscope for Novel Characterization of Ferroelectric Capacitor
• Ferroelectric Properties of Very Thin Pb(Zr_Ti_)O_3 Film Determined by Kelvin Force Microscope
• FERROELECTRIC PROPERTIES OF SOL-GEL DERIVED Pb(Zr, Ti)O_3 CAPACITORS GROWN ON IrO_2 ELECTRODE
• FERROELECTRIC PROPERTIES OF SOL-GEL DERIVED Pb(Zr, Ti)O_3 CAPACITORS GROWN ON IrO_2 ELECTRODE

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