Ferroelectric Properties of Very Thin Pb(Zr_<0.4>Ti_<0.6>)O_3 Film Determined by Kelvin Force Microscope
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-11-30
著者
-
Heo J
Sungkyunkwan Univ. Kyunggi‐do Kor
-
Yi Insook
Osaka Uoiversity
-
Yi Insook
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
-
Jang Daekyu
School Of Inforinarion And Communications Engineering Sungkyunkwan University
-
Chung I
Microelectronics Laboratory Samsung Advanced Institute Of Technology
-
Chung Ilsub
Material & Device Lab Samsung Advanced Institute Of Technology
-
Chung Ilsub
Materials And Devices Lab Samsung Advanced Institute Of Technology
-
Chung Ilsub
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
-
Chung Ilsub
School Of Information And Communication Engineering Sungkyunkwan University
-
Chung Ilsub
School Of Information & Communications Engineering Sungkyunkwan University
-
JANG Dongmin
School of Info rolation and Communications Engineering, Sun gKyunKwan University
-
HEO Jinhee
School of Info rolation and Communications Engineering, Sun gKyunKwan University
-
Chung Ilsub
School of Info rolation and Communications Engineering, Sun gKyunKwan University
関連論文
- Undergate-type Triode Carbon Nanotube Field Emission Display With a Microchannel Plate : Surfaces, Interfaces, and Films
- Effect of Oxygen Plasma Treatment on Hydrogen-Damaged Pt/Pb(Zr_xTi_)O_3/Pt Ferroelectric Thin-Film Capacitor
- Development of Excess Y_2BaCuO_5 during Directional Growth of YBa_2Cu_3O_x
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti)O_3 Capacitor
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti) O_3 Capacitor
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti) O_3 Capacitor
- Effects of Pt Doping on Microstructure of YBa_2Cu_3O_x Superconductor Prepared by Directional Solidification
- FinFET NAND Flash with Nitride/Si Nanocrystal/Nitride Hybrid Trap Layer
- Application of Scanning Probe Microscope for Novel Characterization of Ferroelectric Capacitor
- Ferroelectric Properties of Very Thin Pb(Zr_Ti_)O_3 Film Determined by Kelvin Force Microscope
- Application of Scanning Probe Microscope(SPM) for Novel Characterization of Ferrolectric Capacitor
- Electrical properties of BLT thin films prepared by CSD(chemical Solution Deposition)method
- FERROELECTRIC PROPERTIES OF SOL-GEL DERIVED Pb(Zr, Ti)O_3 CAPACITORS GROWN ON IrO_2 ELECTRODE
- Application of Scanning Probe Microscope(SPM)for Novel Characterization of Ferrolectric Capacitor
- Electrical properties of BLT thin films prepared by CSD(chemical Solution Deposition)method
- FERROELECTRIC PROPERTIES OF SOL-GEL DERIVED Pb(Zr, Ti)O_3 CAPACITORS GROWN ON IrO_2 ELECTRODE
- Evaluation of Aluminum Oxide Thin Film in Magnetic Tunneling Junction Utilizing Scanning Probe Microscopy
- Study On Charge Trap Layers In Charge Trap Metal–Oxide–Semiconductor Field Effect Transistor
- Fin-Type Field-Effect Transistor NAND Flash with Nitride/Silicon Nanocrystal/Nitride Hybrid Trap Layer
- Electrical Characterization of Sub-micron Magnetic Tunneling Junction Cells Using Scanning Probe Microscopy
- Study on Polarization Properties of Randomly Oriented Bi3.35La0.85Ti3O12 Ferroelectric Thin Film Utilizing Three-Dimensional Piezoresponse Image