Chung Ilsub | School of Info rolation and Communications Engineering, Sun gKyunKwan University
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概要
- Chung Ilsubの詳細を見る
- 同名の論文著者
- School of Info rolation and Communications Engineering, Sun gKyunKwan Universityの論文著者
関連著者
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Chung Ilsub
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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HEO Jinhee
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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Chung Ilsub
School Of Information And Communication Engineering Sungkyunkwan University
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Chung Ilsub
School Of Information & Communications Engineering Sungkyunkwan University
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Heo J
Sungkyunkwan Univ. Kyunggi‐do Kor
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Sung Suk
Device Research Team
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Yi Insook
Osaka Uoiversity
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Yi Insook
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
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Jang Daekyu
School Of Inforinarion And Communications Engineering Sungkyunkwan University
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Chung I
Microelectronics Laboratory Samsung Advanced Institute Of Technology
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Chung Ilsub
Material & Device Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Materials And Devices Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
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Park Donggun
Device Research Team
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Choi Byoung
Device Research Team
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CHOE Jeong-Dong
Device Research Team
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LEE Se-Hoon
Device Research Team
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LEE Jong
Device Research Team
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CHO Eun
Device Research Team
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AHN Youngjoon
Device Research Team
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PARK Kyucharn
Device Research Team
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JANG Dongmin
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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Kim T.
Md Laboratory Samsung Advanced Institute Of Technology
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PARK Donggun
Device Research Team, R&D Center, Samsung Electronics Co.
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Hong Suk-kyoung
Memory R&d Division Hynix Semiconductor Inc.
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Lee Kye
School Of Information & Communications Engineering Sungkyunkwan University
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NO Jintae
PD Team, Semiconductor R&D Center, Samsung Electronics Co.
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LEE Junekey
SFD laboratory Samsung Advanced Institute of Technology
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YASTAKE Masatoshi
Seiko Instruments
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No Jintae
Pd Team Semiconductor R&d Center Samsung Electronics Co.
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Lee Se-Hoon
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Dong, Giheung-Gu, Youngin-City, Gyeonggi-Do 449-711, Korea
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Ham Ho
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Choi Byoung
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Dong, Giheung-Gu, Youngin-City, Gyeonggi-Do 449-711, Korea
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No Jintae
Process Development Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Dong, Giheung-Gu, Youngin-City, Gyeonggi-Do 449-711, Korea
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Lee Jong
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Dong, Giheung-Gu, Youngin-City, Gyeonggi-Do 449-711, Korea
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Heo Jinhee
School of Information and Communications Engineering, SungKyunKwan University, 300, Chunchun-Dong, Jangan-Ku, Suwon 440-746, Korea
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Heo Jinhee
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Yeo In-Seok
Process Development Team, Memory Division, Semiconductor Business, Samsung Electronics Co., Ltd., San #24 Nongseo-ri, Giheung-eup, Yongin, Gyeonggi-do 449-177, Korea
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Kim T.
MD Laboratory, Samsung Advanced Institute of Technology, P.O. Box 111, Korea
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Park Seungbae
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Park Seungbae
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Cho Eun
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Dong, Giheung-Gu, Youngin-City, Gyeonggi-Do 449-711, Korea
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Cho Seung
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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Joo Kyong
Process Development Team, Memory Division, Semiconductor Business, Samsung Electronics Co., Ltd., San #24 Nongseo-ri, Giheung-eup, Yongin, Gyeonggi-do 449-177, Korea
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Park Donggun
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Dong, Giheung-Gu, Youngin-City, Gyeonggi-Do 449-711, Korea
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Choe Jeong-Dong
Device Research Team, Semiconductor R&D Center, Samsung Electronics Co., San #24, Nongseo-Dong, Giheung-Gu, Youngin-City, Gyeonggi-Do 449-711, Korea
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Chung Ilsub
School of Information and Communication Engineering, Sungkyunkwan University, Gyeonggi-Do 440-746, Korea
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Chung Ilsub
School of Information and Communications Engineering, SungKyunKwan University, 300, Chunchun-Dong, Jangan-Ku, Suwon 440-746, Korea
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Chung Ilsub
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Park S.
MD Laboratory, Samsung Advanced Institute of Technology, P.O. Box 111, Korea
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Choi Seokheun
School of Information and Communications Engineering, SungKyunKwan University, 300, Chunchun-Dong, Jangan-Ku, Suwon 440-746, Korea
著作論文
- FinFET NAND Flash with Nitride/Si Nanocrystal/Nitride Hybrid Trap Layer
- Application of Scanning Probe Microscope for Novel Characterization of Ferroelectric Capacitor
- Ferroelectric Properties of Very Thin Pb(Zr_Ti_)O_3 Film Determined by Kelvin Force Microscope
- Evaluation of Aluminum Oxide Thin Film in Magnetic Tunneling Junction Utilizing Scanning Probe Microscopy
- Study On Charge Trap Layers In Charge Trap Metal–Oxide–Semiconductor Field Effect Transistor
- Fin-Type Field-Effect Transistor NAND Flash with Nitride/Silicon Nanocrystal/Nitride Hybrid Trap Layer
- Electrical Characterization of Sub-micron Magnetic Tunneling Junction Cells Using Scanning Probe Microscopy
- Study on Polarization Properties of Randomly Oriented Bi3.35La0.85Ti3O12 Ferroelectric Thin Film Utilizing Three-Dimensional Piezoresponse Image