Kim T. | Md Laboratory Samsung Advanced Institute Of Technology
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概要
関連著者
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Kim T.
Md Laboratory Samsung Advanced Institute Of Technology
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Chung Ilsub
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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Lee Kye
School Of Information & Communications Engineering Sungkyunkwan University
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HEO Jinhee
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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Ham Ho
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Heo Jinhee
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Kim T.
MD Laboratory, Samsung Advanced Institute of Technology, P.O. Box 111, Korea
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Park Seungbae
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Park Seungbae
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Chung Ilsub
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Park S.
MD Laboratory, Samsung Advanced Institute of Technology, P.O. Box 111, Korea
著作論文
- Evaluation of Aluminum Oxide Thin Film in Magnetic Tunneling Junction Utilizing Scanning Probe Microscopy
- Electrical Characterization of Sub-micron Magnetic Tunneling Junction Cells Using Scanning Probe Microscopy