HEO Jinhee | School of Info rolation and Communications Engineering, Sun gKyunKwan University
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概要
関連著者
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HEO Jinhee
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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Chung Ilsub
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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Heo J
Sungkyunkwan Univ. Kyunggi‐do Kor
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Yi Insook
Osaka Uoiversity
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Yi Insook
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
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Jang Daekyu
School Of Inforinarion And Communications Engineering Sungkyunkwan University
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Chung I
Microelectronics Laboratory Samsung Advanced Institute Of Technology
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Chung Ilsub
Material & Device Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Materials And Devices Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
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Chung Ilsub
School Of Information And Communication Engineering Sungkyunkwan University
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Chung Ilsub
School Of Information & Communications Engineering Sungkyunkwan University
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JANG Dongmin
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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Hong Suk-kyoung
Memory R&d Division Hynix Semiconductor Inc.
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LEE Junekey
SFD laboratory Samsung Advanced Institute of Technology
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YASTAKE Masatoshi
Seiko Instruments
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Kim T.
Md Laboratory Samsung Advanced Institute Of Technology
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Heo Jinhee
School of Information and Communications Engineering, SungKyunKwan University, 300, Chunchun-Dong, Jangan-Ku, Suwon 440-746, Korea
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Heo Jinhee
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Kim T.
MD Laboratory, Samsung Advanced Institute of Technology, P.O. Box 111, Korea
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Park Seungbae
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Park Seungbae
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Chung Ilsub
School of Information and Communications Engineering, SungKyunKwan University, 300, Chunchun-Dong, Jangan-Ku, Suwon 440-746, Korea
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Chung Ilsub
School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea
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Choi Seokheun
School of Information and Communications Engineering, SungKyunKwan University, 300, Chunchun-Dong, Jangan-Ku, Suwon 440-746, Korea
著作論文
- Application of Scanning Probe Microscope for Novel Characterization of Ferroelectric Capacitor
- Ferroelectric Properties of Very Thin Pb(Zr_Ti_)O_3 Film Determined by Kelvin Force Microscope
- Electrical Characterization of Sub-micron Magnetic Tunneling Junction Cells Using Scanning Probe Microscopy
- Study on Polarization Properties of Randomly Oriented Bi3.35La0.85Ti3O12 Ferroelectric Thin Film Utilizing Three-Dimensional Piezoresponse Image