FinFET NAND Flash with Nitride/Si Nanocrystal/Nitride Hybrid Trap Layer
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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Sung Suk
Device Research Team
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PARK Donggun
Device Research Team, R&D Center, Samsung Electronics Co.
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Chung Ilsub
School Of Information And Communication Engineering Sungkyunkwan University
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Chung Ilsub
School Of Information & Communications Engineering Sungkyunkwan University
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Park Donggun
Device Research Team
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Choi Byoung
Device Research Team
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CHOE Jeong-Dong
Device Research Team
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LEE Se-Hoon
Device Research Team
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LEE Jong
Device Research Team
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CHO Eun
Device Research Team
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AHN Youngjoon
Device Research Team
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NO Jintae
PD Team, Semiconductor R&D Center, Samsung Electronics Co.
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PARK Kyucharn
Device Research Team
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No Jintae
Pd Team Semiconductor R&d Center Samsung Electronics Co.
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Chung Ilsub
School of Info rolation and Communications Engineering, Sun gKyunKwan University
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