Thermal Stability of GaAs/InAs/GaAs Heterostructure Studied by X-Ray Crystal Truncation Rod Scattering Measurement
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-02-28
著者
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Takeda Yoshikazu
Department Of Electrical Engineering Kyoto University:(present Address) Department Of Materials Nago
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Takeda Yoshikazu
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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Tabuchi Masao
Department Of Materials Science And Engineering Nagoya Univ
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Tabuchi Masao
Department Of Materials Science And Engineering. Graduate School Of Engineering Nagoya University
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Takeda Yoshikazu
Department Of Materials Science And Engineering. Graduate School Of Engineering Nagoya University
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ARAKI Munetaka
Department of Materials Science and Engineering. Graduate School of Engineering, Nagoya University
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Tabuchi Masao
Department Of Applied Physics Graduate School Of Engineering Nagoya University
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Araki Munetaka
Department Of Materials Science And Engineering. Graduate School Of Engineering Nagoya University
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