The <111>-Oriented Whiskers of β-SiC Studied by the Field Emission and Field Ion Microscopes
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概要
- 論文の詳細を見る
The <111>-oriented whiskers of β-SiC were studied by field emission and field ion microscopes. Field emission patterns of the A [111]- and B [1^^-1^^-1^^-]-oriented tips were very different from each other, and showed a close resemblance to the pair of patterns obtained by Arther for GaAs. The assignment of each emission pattern of SiC to the A- or B-orientation was made possible with the help of this comparison. Oxygen adsorption properties of these tips were not substantially different. A distinct difference between the two orientations was also found in the hydrogen ion patterns imaged at relatively high fields. An interpretation of this difference was rendered possible with the model of Knor and Muller.
- 社団法人応用物理学会の論文
- 1975-01-05
著者
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Kudo Jun
Institute Of Scientific And Industrial Research Osaka University
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Kuroda Tsukasa
Institute Of Scientific And Industrial Research Osaka University
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NAKAMURA Shogo
Institute of Scientific and Industrial Research, Osaka University
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Nakamura Shogo
Institute Of Scientific And Industrial Research Osaka Univerisity
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Nakamura Shogo
Institute Of Scientif And Industrial Research Osaka University
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