Kuroda Tsukasa | Institute Of Scientific And Industrial Research Osaka University
スポンサーリンク
概要
関連著者
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Kuroda Tsukasa
Institute Of Scientific And Industrial Research Osaka University
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Nakamura Shogo
Institute Of Scientific And Industrial Research Osaka Univerisity
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Nakamura Shogo
Institute Of Scientif And Industrial Research Osaka University
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NAKAMURA Shogo
Institute of Scientific and Industrial Research, Osaka University
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Kuroda T
Waseda Univ. Tokyo Jpn
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Kuroda T
Institute Of Scientific And Industrial Research Osaka University
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Tamaki Shigeru
Graduate School Of Integrated Science Yokohama City University
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Tamaki S
Graduate School Of Integrated Science Yokohama City University
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Tamaki Shozo
Osaka Prefectural Industrial Technology Research Institute
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Tamaki Shozo
Osaka Prefectural Industrial Research Institute
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Iwakuro Hiroaki
Research and Development Department, Shindengen Electric Manufacturing Co., Ltd.
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Iwakuro H
Shindengen Electric Mfg. Co. Ltd. Saitama Jpn
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Yagi Hideki
Konoshima Chemical Co. Ltd.
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Yagi H
Konoshima Chemical Co. Ltd.
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Kuroda Tsukasa
Institute Of Scientific And Industrial Reserch Osaka University
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Yagyu H
Matsushita Electric Works Ltd. Osaka Jpn
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Yagi Hideichi
Institute of Scientific and Industrial Research, Osaka University
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Yamauchi Naohiko
Osaka Prefectural Industrial Technology Research Institute
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IWAKURO Hiroaki
Shindengen Electric Mfg. Co., Ltd.
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Tamaki Shozo
Institute Of Scientific And Industrial Research Osaka University
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Iwakuro Hiroaki
Shindengen Electric Mfg. Co. Ltd.
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KINOSITA Kenji
Institute of Scientific and Industrial Research, Osaka University
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Kinosita Kenji
Institute Of Scientific And Industrial Reserch Osaka University
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Nakamura Shogo
Institute Of Scientific And Industrial Reserch Osaka University
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Kudo Jun
Institute Of Scientific And Industrial Research Osaka University
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Kuroda Tsukasa
Institute Of Scientific And Industrical Research Osaka University
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Ohno Youichi
Institute Of Scientific And Industrical Research Osaka University
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Nakamura Shogo
Institute Of Scientific And Industrial Research Osaka University
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Ogasawara Toshihide
Institute of Scientific and Industrial Research, Osaka University
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Tuchida Masahiko
Institute of Scientific and Industrial Research, Osaka University
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Mori Hirotaroh
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University
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TOKONAMI Masayasu
Faculty of Science, The University of Tokyo
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KITATSUJI Yasuji
Yatsushiro National College of Technology
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Mori Hirotaroh
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Iwakuro Hiroaki
Institute Of Scientific And Industrial Research Osaka University:(present Address)shindengen Electri
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YAMAUCHI Noriyoshi
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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Inoue Toru
Institute of Scientific and Industrial Research, Osaka University
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NISHIGAKI Satoshi
Institute of Scientific and Industrial Research, Osaka University
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ADACHI Toshiyuki
Institute of Scientific and Industrial Research, Osaka University
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TSUCHIDA Masahiko
Institute of Scientific and Industrial Research, Osaka University
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SHIMIZU Takashi
Total Technical Supervision Department of Electronic Devices, Shindengen Electric Manufacturing Co.,
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Tuchida Masahiko
Institute Of Scientific And Industrial Research Osaka University
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Ogasawara Toshihide
Institute Of Scientific And Industrial Research Osaka University
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Nishigaki Satoshi
Institute Of Scientific And Industrial Research Osaka University:(present Address)fritz-haber-instit
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Nishigaki Satoshi
Institute Of Scientific And Industrial Research Osaka University
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Adachi Toshiyuki
Institute Of Scientif And Industrial Research Osaka University
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Tsuchida M
Osaka Univ. Ibaraki Jpn
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Kuroda Tsukasa
Institute Of Scientificand Industrial Research Osaka University
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Kinoshita Kenji
Institute Of Scientific And Industrial Research Osaka University
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Kinoshita Kenji
Institute For Life Science Research Asahi Chemical Industry Co. Ltd.
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Tokonami M
Saitama Inst. Technol. Saitama Jpn
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Adachi Toshiyuki
Institute Of Molecular And Cellular Biology For Pharmaceutical Sciences Kyoto Pharmaceutical Univers
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Inoue Toru
Institute Of Scientific And Industrial Research Osaka University:osaka Electro-communication Univers
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Nakamura Shogo
Institute Of Scientific And Industrical Research Osaka University
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Nakamura Shogo
Institute Of Scientificand Industrial Research Osaka University:(present Address)central Research La
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Shimizu Takashi
Total Technical Supervision Department Of Electronic Devices Shindengen Electric Manufacturing Co. L
著作論文
- Characterization of Abrasively Processed Surface of Si(100) Wafer
- Mechanism of Secondary Ion Emission from Silicon Dioxide Bombarded with Argon tons
- Interfacial Layers of High-Barrier Schottky Diode of Al/n-Type (100)Si Exposed to H_2 Plasma
- Simulation of Positive Secondary-Ion Emission from Ar+-(or O2+-) Bombarded Fe-Based Alloys by Local Thermodynamic Equilibrium Model
- Mechanisms of Field Ionization and Field Evaporation on Semiconductor Surfaces
- High-Barrier Schottky Diodes on N-Type Si(100) Due to Hydrogen Plasma
- Remolding of Tungsten Field Emitter
- Cohesion of Surface Atoms of Tungsten-Hemispherical Crystal Observed by Field Ion Microscope
- Field-Evaporation of Tungsten in Field Ion Microscope
- Surface Shape Changes of Tungsten Emitter Studied by the Field Ion Microscopy
- The -Oriented Whiskers of β-SiC Studied by the Field Emission and Field Ion Microscopes
- Comparison of Brightness of Field-Ion Image for Different Metals
- Modification of Silicon Dioxide by Hydrogen and Deuterium Plasmas at Room Temperature
- Crystal Structure of TiN Film Fabricated by Reactive Sputtering on Si(100) Substrate
- Observation of Surface Phenomena of Rhenium by F.E.M. and F.I.M.
- Determination of the Ionization States of Field Evaporated Atoms with an Atom-Probe-FIM
- Difference of Relative Abundance Ratio of Field Evaporated Ions for Different Faces of the Molybdenum Crystal
- Ionization States of Ions Field-Evaporated from the Refractory Metal Alloys
- Direct Observation of the Epitaxial Growth Phenomenon of Cesium on a Tungsten Emitter with a Field Emission Microscope
- Atom Probe Analysis of Random Image Spots Caused by Residual Gas Adsorption
- Field-Ion Microscope Images of Fe-Cu Alloy
- Gas-Surface Interaction in Atom-Probe Field-Ion Microscope