The Effect of an Electric Field for Surface Migration on Tungsten-Rhenium Alloy in Field-Ion Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1976-09-05
著者
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Nakamura Shogo
Institute Of Scientific And Industrial Research Osaka Univerisity
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Adachi Toshiyuki
Institute Of Scientif And Industrial Research Osaka University
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Adachi Toshiyuki
Institute Of Molecular And Cellular Biology For Pharmaceutical Sciences Kyoto Pharmaceutical Univers
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Nakamura Shogo
Institute Of Scientif And Industrial Research Osaka University
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- The Effect of an Electric Field for Surface Migration on Tungsten-Rhenium Alloy in Field-Ion Microscope
- Corrosion of Tungsten Tip by Residual Gas in Field Ion Microscope
- FIM Observation of Interactions between W Atoms on W Surfaces
- A Field Ion Microscope Study of Thin Films of Molybdenum on Tungsten, Iridium and Rhenium
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