Temperature and Field Effects on Atomic Arrangements of Clean Tungsten Tip Surfaces Observed by FIM
スポンサーリンク
概要
- 論文の詳細を見る
When clean tungsten tip surfaces were exposed to a high electric field, preferential field evaporation or field-induced surface-atomic rearrangement occurred. New structures which appeared on the (211), (310), (100) and (332) planes were explained to be due to the dipole-dipole and the Coulomb repulsive interactions among neighboring atoms. The tip was heated at 300-1500 K under zero field. On the (211) plane a (3×1)-like super-structure appeared at low temperatures and a (2×1)-like structure at high temperatures. A new structure like a rhomboidal lattice was observed on the (111) plane. Some mechanisms causing these rearrangements on the planes with limited areas are discussed.
- 社団法人応用物理学会の論文
- 1976-01-05
著者
-
Nakamura Shogo
Institute Of Scientific And Industrial Research Osaka Univerisity
-
NISHIGAKI Satoshi
Institute of Scientific and Industrial Research, Osaka University
-
Nishigaki Satoshi
Institute Of Scientific And Industrial Research Osaka University
-
Nakamura Shogo
Institute Of Scientif And Industrial Research Osaka University
関連論文
- Field-Ion Images of Ordered Ni_3Mo Alloy and Their Computer Simulation
- Field-Evaporation End Form of Ordered Ni_4Mo Alloy
- A Method of Determining the Types of Ordered Domains of β-Ni_4Mo in Field-Ion Images
- Field-Ion Microscope Study of Early Stages of Ordering in Ni_4Mo Alloy
- XPS Study on Oxide/GaSb Interfacial Chemical Reaction at Room Temperature
- Enhancement of Surface Plasmon excitation by Low-Energy Electron due to Surface Resonance on Si (001)-2×1
- ESR and Electric Conductance Studies of the Fine-Powdered SnO_2
- Field Emission from Superconductors
- Mechanisms of Field Ionization and Field Evaporation on Semiconductor Surfaces
- Remolding of Tungsten Field Emitter
- Surface Shape Changes of Tungsten Emitter Studied by the Field Ion Microscopy
- The -Oriented Whiskers of β-SiC Studied by the Field Emission and Field Ion Microscopes
- Comparison of Brightness of Field-Ion Image for Different Metals
- Temperature-Dependence of Field Evaporation End Form of Tungsten in Field Ion Microscope
- Determination of the Ionization States of Field Evaporated Atoms with an Atom-Probe-FIM
- Difference of Relative Abundance Ratio of Field Evaporated Ions for Different Faces of the Molybdenum Crystal
- A Field-Ion Microscope for Operation at 4.2 K
- SiC Whisker as a Field Emitter
- Ionization States of Ions Field-Evaporated from the Refractory Metal Alloys
- Atom Probe Analysis of Random Image Spots Caused by Residual Gas Adsorption
- Field-Ion Microscope Images of Fe-Cu Alloy
- Gas-Surface Interaction in Atom-Probe Field-Ion Microscope
- The Effect of an Electric Field for Surface Migration on Tungsten-Rhenium Alloy in Field-Ion Microscope
- Corrosion of Tungsten Tip by Residual Gas in Field Ion Microscope
- FIM Observation of Interactions between W Atoms on W Surfaces
- A Field Ion Microscope Study of Thin Films of Molybdenum on Tungsten, Iridium and Rhenium
- Temperature and Field Effects on Atomic Arrangements of Clean Tungsten Tip Surfaces Observed by FIM
- An Atomic View of Surface Self-Diffusion on the Tungsten Tip with or without High Fields
- Epitaxial Growth of Molybdenum Films on Cooled Tungsten Tips at 78 K
- Direct Investigation on Interactions between Molybdenum Adatoms on Tungsten Surfaces