Characterization of Multilayered Structures by Piezoelectric Photoacoustic Imaging : Photoacoustic Effect and Spectroscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-08-31
著者
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Kanemitsu Yoshihiko
Institute Of Physics University Of Tsukuba
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Kanemitsu Yoshihiko
The Institute For Solid State Physics The University Of Tokyo
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Kanemitsu Yoshihiko
The Institute For Solid State Physics The University Of Tokyo:(present Address) Department Of Image
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Masumoto Y
Univ. Tsukuba Ibaraki Jpn
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Kanemitsu Y
Nara Inst. Sci. And Technol. Nara Jpn
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Kanemitsu Y
Department Of Image Science And Technology Faculty Of Engineering Chiba University
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Kanemitsu Yoshihiko
Institute For Chemical Research Kyoto University
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NABETA Hiroyuki
Institute of Physics, University of Tsukuba
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NAGATA Yoshihiko
Mechanical Engineering Laboratory
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YAMANAKA Kazushi
Mechanical Engineering Laboratory
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KODA Toshio
Mechanical Engineering Laboratory
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MASUMOTO Yasuaki
Mechancal Engineering Laboratory
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Yamanaka Kazushi
Mechanfical Engineering Laboratory
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NAGATA Yujiro
College of Science and Engineering, Aoyama Gakuin University
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Koda T
Mechanical Engineering Laboratory
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Nagata Y
College Of Science And Engineering Aoyama Gakuin University
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Nagata Yujiro
College Of Science & Engineering Aoyama Gakuin University
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鍋田 博之
コニカ株式会社MG材料システム開発センター
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Nabeta H
Institute Of Physics University Of Tsukuba
関連論文
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- Blue Light Emission from Rapid-Thermal-Oxidized Porous Silicon
- Large Induced Absorption Change in Porous Silicon and Its Application to Optical Logic Gates
- Hydrogen Termination and Optical Properties of Porous Silicon : Photochemical Etching Effect
- Evaluation of Amorphous Semiconductors by Photoacoustic Spectroscopy Using a Transparent Transducer : Photoacoustic Spectroscopy
- Photoacoustic Characterization of Semiconductor Heterostructures : Physical Acoustics
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- Dynamics of Rapid Phase Transformations in Amorphous GeTe Induced by Nanosecond Laser Pulses : Media
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- 写真用抑制剤の吸着性と絶対ハードネスの相関
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- 1-PG-6 光音響分光用透明トランスデューサーの特性とアモルファス半導体薄膜の評価への応用(1-P.ポスターセッション(概要講演))
- Analysis of Subsurface Cracks in Acoustic Microscopy : Ultrasonic Microscopy and Nondestructive Testing
- Acoustic Microscopy of Ceramics Sliding Materials : Ultrasonic Imaging and Microscopy
- Observation of Subsurface Flaws with Scanning Acoustic Microscope : Non-Destructive Testing
- Acoustic Microscopy of Ceramics Indentation Fracture : Ultrasonic Imaging and Microscopy
- New Imtermetallic Compound Found in Sm -Fe System
- Analysis of Subsurface Imaging and Effect of Contact Elasticity in the Ultrasonic Force Microscope
- Evaluation of MeV Si Implanted Si Using Beam Acoustic Method : Ultrasonic Imaging and Microscopy
- Characterizaton of Ion Implanted Layer Using Ion-Induced Acoustic Signal : Physical Acoustics
- Improvement of Piezoelectric Photoacoustic Imaging Using Two Images at Different Modulation Frequencies : Photoacoustic Spectroscopy
- Photoluminescence from Silicon Quantum Crystallites : Core and Surface States
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- Formation of Periodic Ripple Structures in Picosecond Pulsed Laser Annealing of Ion-Implanted Silicon
- Generation and Directivity Control of Bulk Acoustic Waves by Phase Velocity Scanning of Laser Interference Fringes
- Optical Probe Detection of High-Frequency Surface Acoustic Waves Generated by Phase Velocity Scanning of Laser Interference Fringes
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