Measurement of Piezoelectric Displacements of Pb(Zr, Ti)O_3 Thin Films Using a Double-Beam Interferometer
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-09-30
著者
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眞岩 宏司
湘南工科大学工学部
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Kim D‐j
Hantech Co. Ltd.
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Kim D‐j
Hantech Co. Ltd. Kyungki‐do Kor
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MAIWA Hiroshi
Department of Materials Science and Engineering, Shonan Institute of Technology
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KIM SEUNG-HYUN
Department of Psychiatry, Korea University College of Medicine
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Kim Dong-joo
Department Of Computer Science And Engineering Hanyang University
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Kim Seung-hyun
Department Of Materials Science And Engineering North Carolina Sate University
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Kim Seung-hyun
Department Of Allergies And Rheumatology Ajou University School Of Medicine
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Chiristman James
Department of Physics, North Carolina Sate University
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Maria Jon-Paul
Department of Materials Science and Engineering, North Carolina Sate University
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Chen Barry
ATMI Inc.
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Streiffer Stephen
Materials Science Division, Argonne National Laboratory
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Kingon Angus
Department of Materials Science and Engineering, North Carolina Sate University
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Kingon Angus
Department Of Materials Science And Engineering North Carolina Sate University
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Maria Jon-paul
Department Of Materials Science And Engineering North Carolina Sate University
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Streiffer Stephen
Materials Science Division Argonne National Laboratory
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Kim Dong-joo
Department Of Chemical Engineering Kangwon National University
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Chiristman James
Department Of Physics North Carolina Sate University
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Christman James
Department of Physics, North Carolina Sate University
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Maiwa Hiroshi
Department of Human and Environmental Science, Shonan Institute of Technology, 1-1-25 Tsujido Nishikaigan, Fujisawa, Kanagawa 251-8511, Japan
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