Chen Barry | ATMI Inc.
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概要
関連著者
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眞岩 宏司
湘南工科大学工学部
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Chen Barry
ATMI Inc.
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Kim D‐j
Hantech Co. Ltd.
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Kim D‐j
Hantech Co. Ltd. Kyungki‐do Kor
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MAIWA Hiroshi
Department of Materials Science and Engineering, Shonan Institute of Technology
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KIM SEUNG-HYUN
Department of Psychiatry, Korea University College of Medicine
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Kim Dong-joo
Department Of Computer Science And Engineering Hanyang University
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Kim Dong
湘南工科大学工学部材料工学科
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Kim Seung-hyun
Department Of Materials Science And Engineering North Carolina Sate University
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Kim Seung
湘南工科大学工学部材料工学科
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Kim Seung-hyun
Department Of Allergies And Rheumatology Ajou University School Of Medicine
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Chiristman James
Department of Physics, North Carolina Sate University
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Maria Jon-Paul
Department of Materials Science and Engineering, North Carolina Sate University
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Streiffer Stephen
Materials Science Division, Argonne National Laboratory
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Kingon Angus
Department of Materials Science and Engineering, North Carolina Sate University
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Chen Barry
Atmi Inc. Danbury Ct 06180 U.s.a.
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Kingon Angus
Department Of Materials Science And Engineering North Carolina Sate University
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Kingon Angus
湘南工科大学工学部材料工学科
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Maria Jon-paul
Department Of Materials Science And Engineering North Carolina Sate University
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Maria Jon
湘南工科大学工学部材料工学科
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Streiffer S
Mat. Sci. Div. Argonne Natl. Lab.
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Streiffer Stephen
Materials Science Division Argonne National Laboratory
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Kim Dong-joo
Department Of Chemical Engineering Kangwon National University
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Chiristman James
Department Of Physics North Carolina Sate University
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真岩 宏司
湘南工科大学
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CHRISTMAN James
Dept. Phys., North Carolina State Univ.
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STREIFFER Stephen
Mat. Sci. Div., Argonne Natl. Lab.
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NEMANICH R.J.
Dept. Phys., North Carolina State Univ.
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Nemanich R.j.
Dept. Phys. North Carolina State Univ.
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Christman J
Dept. Phys. North Carolina State Univ.
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Christman James
Department of Physics, North Carolina Sate University
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Maiwa Hiroshi
Department of Human and Environmental Science, Shonan Institute of Technology, 1-1-25 Tsujido Nishikaigan, Fujisawa, Kanagawa 251-8511, Japan
著作論文
- PZT 薄膜の縦方向圧電係数の測定
- Measurement of Piezoelectric Displacements of Pb(Zr, Ti)O_3 Thin Films Using a Double-Beam Interferometer