Thickness Dependence of the Electrical and Electromechanical Properties of Pb(Zr, Ti)O_3 Thin Films
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-07-15
著者
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Hiroshi Maiwa
Department Of Materials Science And Engineering Shonan Institute Of Technology
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Ichinose Noboru
Department Of Materials Science And Engineering School Of Science And Engineering Waseda University
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MAIWA Hiroshi
Department of Materials Science and Engineering, Shonan Institute of Technology
関連論文
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- Measurement of Piezoelectric Displacements of Pb(Zr, Ti)O_3 Thin Films Using a Double-Beam Interferometer
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- Electrical and Electromechanical Properties of PbZrO_3 Thin Films Prepared by Chemical Solution Deposition
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