Efficient Methods for Guided-Probe Diagnosis (Special Issue on VLSI Testing and Testable Design)
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概要
- 論文の詳細を見る
To speed up a guided-probe diagnosis process, the number of probed lines needs to be reduced. This paper presents two efficient probing line determination methods by which the number of probed lines is either small or minimum. The concept of fault probability is introduced to reflect the fact that not all gates have the same probability to be faulty. Experimental results show the effectiveness of the proposed methods.
- 社団法人電子情報通信学会の論文
- 1993-07-25
著者
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Xiaoqing Wen
Faculty Of Engineering Osaka University
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Kinoshita Kozo
Faculty Of Informatics Osaka Gakuin University
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Kinoshita Kozo
Faculty Of Engineering Osaka University
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Itazaki Noriyoshi
Faculty of Engineering, Osaka University
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Itazaki Noriyoshi
Faculty Of Engineering Osaka University
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