Efficient Guided-Probe Fault Location Method for Sequential Circuits
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概要
- 論文の詳細を見る
The efficiency of a guided-probe fault location process is affected by the number of the probed lines. This number depends on the size of the target area and the method by which a line is selected for probing. This paper presents a method for reducing the size of the target area in a sequential circuit by introducing the concepts of Type-I and Type-II faults. This paper also presents a method of selecting lines for probing in a more efficient way. The efficiency of the proposed methods is demonstrated by experimental results.
- 社団法人電子情報通信学会の論文
- 1995-02-25
著者
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Tamamoto Hideo
Mining College Akita University
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Kinoshita Kozo
Faculty Of Engineering Osaka University
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Wen Xiaoging
Mining College, Akita University
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Yokoyama Hiroshi
Mining College, Akita University
-
Wen Xiaoging
Mining College Akita University
-
Yokoyama Hiroshi
Mining College Akita University
-
Kinoshita Kozo
Faculty of Engineering, Osaka University
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