Analysis of High Power Amplifier Instability due to f_0/2Loop Oscillation
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概要
- 論文の詳細を見る
A novel nonlinear analysis method of high power amplifier instability has been developed. This analysis method deals with a loop oscillation in a closed loop circuit and presents the conditions for oscillation under large-signal operation by taking account of a mixing effect of FETs. Applying this analysis to the high power amplifier instability that an output power for the fundamental wave (f_0-wave) decreases at some compression point where a half of the fundamental wave (f_0/2-wave) is observed, it has been found that this instability is caused by an f_0/2 loop oscillation. In addition, it has been verified by analysis and experiment that the oscillation can be removed by employing an isolation resistor in a closed loop circuit.
- 社団法人電子情報通信学会の論文
- 1995-08-25
著者
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TAKAGI Tadashi
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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Takagi T
Optical Interconnection Sumiden Laboratory Rwcp
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Itoh Yasushi
Electro-Optics amp Microwave Systems Laboratory, Mitsubishi Electric Corporation
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Mochizuki Mitsuru
Oki Electric Industry Co. Ltd.
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Takagi T
Research Institute Of Electrical Communication Tohoku University
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TARUI Yukinobu
Kamakura Works, Mitsubishi Electric Corporation
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Tsuji Seiichi
Central Research Laboratory Hitachi Ltd.
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Mitsui Y
Mitsubishi Electric Corp. Itami‐shi Jpn
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Mitsui Yasuo
Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation
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Itoh Y
Shonan Inst. Of Technol. Fujisawa‐shi Jpn
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Tarui Y
Kamakura Works Mitsubishi Electric Corporation
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Mochizuki Mitsuru
Electro-Optics amp Microwave Systems Laboratory, Mitsubishi Electric Corporation
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Tarui Yukinobu
Electro-Optics amp Microwave Systems Laboratory, Mitsubishi Electric Corporation
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Tsuji Seiichi
Kitaitami Works, Mitsubishi Electric Corporation
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Tsuji Seiichi
Kitaitami Works Mitsubishi Electric Corporation
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Itoh Yasushi
Electo-optics And Microwave Systems Laboratory Mitsubishi Electric Corporation
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