Studies on Sputtered NdFeB Thin Films for Perpendicular Magnetic Recording

概要

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The effects of magnetic layer thickness and boron addition on the microstructure and magnetic properties of NdFeB thin films sputtered onto W underlayer have been investigated. The films could maintain prominent perpendicular magnetic anisotropy when their thickness values were smaller than 30 nm. Beyond this value, the c-axis orientations of magnetic grains became irregular gradually. Moderate boron addition could effectively suppress grains growth and narrow grain size distributions as well as tailor the high coercivity force to an applicable value while keeping a relative high remanent ratio. The grains also became more isolated.
社団法人電子情報通信学会の論文
2002-10-31