Selective Etching of High-k Dielectric HfO_2 Films over Si in BCl_3-Containing Plasmas without rf Biasing
スポンサーリンク
概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2009-01-25
著者
-
NAKAMURA Keisuke
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University
-
Ono Kouichi
Department Of Aeronautics And Astronautics Graduate School Of Engineering Kyoto University
-
Eriguchi Koji
Department Of Aeronautics And Astronautics Graduate School Of Engineering Kyoto University
-
UEDA Yoshinori
Department of Electronics and Electrical Engineering, Keio University
-
HAMADA Daisuke
Department of Orthopedics, Institute of Health Biosciences, The University of Tokushima
-
Hamada Daisuke
Department Of Aeronautics And Astronautics Graduate School Of Engineering Kyoto University
-
Ueda Yoshinori
Department Of Aeronautics And Astronautics Graduate School Of Engineering Kyoto University
-
Ono Kouichi
Department Of Aeronautical Engineering Faculty Of Engineering Kyoto University
-
Nakamura Keisuke
Department Of Aeronautics And Astronautics Graduate School Of Engineering Kyoto University
関連論文
- Development of a TES Microcalorimeter for Spectroscopic Measurement of LX-rays Emitted by Transuranium Elements
- An Atomic Scale Model of Multilayer Surface Reactions and the Feature Profile Evolution during Plasma Etching
- Numerical Analysis of the Electromagnetic Fields in a Microwave Plasma Source Excited by Azimuthally Symmetric Surface Waves
- Transcranial Optical Imaging of Cold-Injured Brain in Rat
- Replication of reported genetic associations of PADI4, FCRL3, SLC22A4 and RUNX1 genes with rheumatoid arthritis : results of an independent Japanese population and evidence from meta-analysis of East Asian studies
- Life expectancies of Japanese patients with rheumatoid arthritis : a review of deaths over a 20-year period
- Arg124Cys Mutation of the βig-h3 Gene in a Japanese Family With Lattice Corneal Dystrophy Type I
- A Comparative Study of Plasma Source-Dependent Charging Polarity in MOSFETs with High-k and SiO_2 Gate Dielectrics
- Quantitative Characterization of Plasma-Induced Defect Generation Process in Exposed Thin Si Surface Layers
- Plasma Diagnostics and Thrust Performance Analysis of a Microwave-Excited Microplasma Thruster
- A Model Analysis of Feature Profile Evolution and Microscopic Uniformity during Polysilicon Gate Etching in Cl_2/O_2 Plasmas
- Molecular-Dynamics-Based Profile Evolution Simulation for Sub-10-nm Si Processing Technology
- Selective Etching of High-k Dielectric HfO_2 Films over Si in BCl_3-Containing Plasmas without rf Biasing
- Asynchronous progressive diaphyseal dysplasia
- Molecular Dynamics Analysis of the Formation of Surface Roughness during Si Etching in Chlorine-Based Plasmas
- Three-Dimensional Atomic-Scale Cellular Model and Feature Profile Evolution during Si Etching in Chlorine-Based Plasmas: Analysis of Profile Anomalies and Surface Roughness
- Particle Simulations of Sheath Dynamics in Low-Pressure Capacitively Coupled Argon Plasma Discharges
- Transcranial Photoacoustic Measurements of Cold-Injured Brains in Rats
- Atomic-Scale Cellular Model and Profile Simulation of Si Etching: Analysis of Profile Anomalies and Microscopic Uniformity
- The Applicability of Formal Specification to Maintenance of Large-Scale Software
- Molecular Dynamics Evaluation of Thermal Transport in Naked and Oxide-Coated Silicon Nanowires
- Design and Preparation of the Tetrapeptides as Low Molecular Sized BACE1 Inhibitors
- Indications of total ankle arthroplasty for rheumatoid arthritis : evaluation at 5 years or more after the operation
- Effect of Abnormal Outflow from End Stages on Concentration Profile in Uranium-Stripping Bank of PUREX Flowsheet
- Plasma Formation in a Neutral Gas by a Short-Pulsed, High-Current Electron Beam
- Beam and Plasma Currents in an Injection of a Short-Pulsed, High-Current Electron Beam into Initially-Neutral Gases
- Visible and Ultraviolet High-Intensity Spectral Lines in Electron-Beam-Produced Plasmas
- Clinical efficacy of naftopidil on lower urinary tract symptoms after radical prostatectomy
- Etching of High-k Dielectric HfO2 Films in BCl3-Containing Plasmas Enhanced with O2 Addition
- Numerical Investigation on Origin of Microscopic Surface Roughness during Si Etching by Chemically Reactive Plasmas
- Numerical Study on Si Etching by Monatomic Br+/Cl+ Beams and Diatomic Br2+/Cl2+/HBr+ Beams
- Molecular Dynamics Simulation of Si Etching by Off-Normal Cl+ Bombardment at High Neutral-to-Ion Flux Ratios
- Molecular-Dynamics-Based Profile Evolution Simulation for Sub-10-nm Si Processing Technology
- UV〜Near-IR Laser Lines in Electron-Beam-Produced Rare Gas Plasmas
- Effects of Mask Pattern Geometry on Plasma Etching Profiles
- Laser Action of Ionized and Neutral Atomic Lines in Electron-Beam-Produced Rare Gas Plasmas
- On Early-Stage-Excitation Processes of KrII and XeII Lines in Pulsed-Electron-Beam Produced Plasmas
- A Model Analysis of Feature Profile Evolution and Microscopic Uniformity during Polysilicon Gate Etching in Cl2/O2 Plasmas
- An Atomic Scale Model of Multilayer Surface Reactions and the Feature Profile Evolution during Plasma Etching
- Modeling and Simulation of Nanoscale Surface Rippling during Plasma Etching of Si under Oblique Ion Incidence
- Plasma Diagnostics and Thrust Performance Analysis of a Microwave-Excited Microplasma Thruster
- Quantitative Characterization of Plasma-Induced Defect Generation Process in Exposed Thin Si Surface Layers
- Comparative Study of Plasma Source-Dependent Charging Polarity in Metal–Oxide–Semiconductor Field Effect Transistors with High-$k$ and SiO2 Gate Dielectrics
- An Improvement of Stillinger–Weber Interatomic Potential Model for Reactive Ion Etching Simulations
- Microwave-Excited High-Density Plasma Column Sustained along Metal Rod at Negative Voltage
- The genes exchange probabilities in inversion of GA(New Development of SOFT Science in BMFSA2009-AMAMI)