Current Development Status and Future Challenge of FeRAM Technologies
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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KIM Kinam
Semiconductor R&D Center, Samsung Electronics Co. Ltd.
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LEE S.
Semiconductor R&D Center, Samsung Electronics Co., Ltd.
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Kim Kinam
Semiconductor R & D Center Memory Division Semiconductor Business Samsung Electronics Co. Ltd.
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Lee S.
Semiconductor Advanced Research Div. Hyundai Electronics Industries Co.
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Lee S.
Semiconductor R & D Center Memory Division Semiconductor Business Samsung Electronics Co. Ltd.
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- Inter-Layer Dielectric Reliability on 1GDRAM with COB Structure
- Current Development Status and Future Challenge of FeRAM Technologies
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