Dynamic Data Retention Degradation in FD-SOI DRAM Cells Due to Source-Induced Charge Accumulation(SICA) Effect

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概要

• 論文の詳細を見る
• 1997-09-16

著者

• SIM Jai-hoon

  Semiconductor R&D Center, Samsung Electronics Co. Ltd.

• KIM Kinam

  Semiconductor R&D Center, Samsung Electronics Co. Ltd.

• Sim Jai-hoon

  Semiconductor R&d Center Samsung Electronics Co.

• Kim Kinam

  Semiconductor R & D Center Memory Division Semiconductor Business Samsung Electronics Co. Ltd.

• Kim Kinam

  Semiconductor R&D Center, Samsung Electronics Co.

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• Dynamic Data Retention Degradation in FD-SOI DRAM Cells Due to Source-Induced Charge Accumulation(SICA) Effect
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