Reliability and Memory Characteristics of Sequential Laterally Solidified LTPS TFT with a ONO Stack Gate Dielectric
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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Chen Yu-cheng
Electronics Research And Service Organization Industrial Technology Research Institute
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King Ya-chin
Microelectronic Laboratory Semiconductor Technology Application Research (star) Group Department Of
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Chen Hung-tse
Electronics Research And Service Organization Industrial Technology Research Institute
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King Ya-chin
Microelectronics Lab. Star Group Department Of Electrical Engineering National Tsing-hua University
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HSIEH Ssu-I
Microelectronics Lab., STAR Group, Department of Electrical Engineering National Tsing-Hua Universit
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CHEN Chi-Lin
Electronics Research and Service Organization Industrial Technology Research Institute
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LIN Jia-Xing
Electronics Research and Service Organization Industrial Technology Research Institute
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Hsieh Ssu-i
Microelectronics Lab. Star Group Department Of Electrical Engineering National Tsing-hua University
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