Floating Body Accelerated Oxide Breakdown Progression in Ultra-Thin Oxide SOI pMOSFETs
スポンサーリンク
概要
- 論文の詳細を見る
- 2004-09-15
著者
-
CHEN M.
Department of Electrical and Electronic Engineering, Gifu University
-
Wang Tahui
Dept. Of Electronics Engineering National Chiao-tung University
-
Wang Tahui
Department Of Electronic Engineering National Chiao Tung University
-
TANG C.
Department of Materials and Optoelectronic Science, Center for Nanoscience and Nanotechnology, Natio
-
Chan C.
Department Of Applied Biology And Chemical Technology Hong Kong Polytechnic University
-
TANG C.
Dept. of Electronics Engineering, National Chiao-Tung University
-
CHAN C.
Dept. of Electronics Engineering, National Chiao-Tung University
-
KUO C.
Department of Electronics Engineering, National Chiao-Tung University
-
Tang C.
Department Of Materials And Optoelectronic Science Center For Nanoscience And Nanotechnology Nationa
-
Tang C.
Dept. Of Electronics Engineering National Chiao-tung University
-
Chen M.
Department Of Electronics Engineering National Chiao-tung University
-
Chan C.
Dept. Of Electronics Engineering National Chiao-tung University
-
Chen M.
Department Of Electrical And Electronic Engineering Gifu University
関連論文
- Viscous Flow Behavior and Workability of Mg-Cu-(Ag)-Gd Bulk Metallic Glasses
- LEADER PROPERTIES AND ATTACHMENT PROCESS IN POSITIVE TRIGGERED LIGHTNING FLASHES
- SOME RESULTS OF INVESTIGATION ON SLOW FRONT OF RETURN STROKE ELECTRIC WAVEFORM
- Return-stroke Speeds Measured in the Lowest 100m of Rocket-triggered Lightning Channel
- Mechanical Behavior of Au-Based Metallic Glass in Micro-Scale at Ambient and Elevated Temperatures
- Simulation of Positive Oxide Trapped Charge Induced Leakage Current and Read-Disturb in Flash EEPROMs
- Stress Induced Subthreshold Current Hump in Short Gate-Length pMOSFET's with Shallow Trench Isolation
- Temperature Effect on Off-State Drain Leakage Current in a Hot-Carrier Stressed n-MOSFET
- A Comparative Study of Interface Trap Induced Drain Leakage Current in Various n-MOSFET Structures
- Oxide Thickness Dependence of Hot Carrier Stress Induced Drain Leakage Current Degradation in Thin-Oxide n-MOSFET's
- Deuterium Effect on Stress-Induced Leakage Current
- Edge Direct Tunneling (EDT) Induced Drain and Gate Leakage in Ultrathin Gate Oxide MOSFETs
- A Preliminary Study on Triggering Lightning with Transient Flames
- Analysis of 5-methoxytryptamine at the femtomole level in the rat and quail brain by gas chromatography-electron-capture negative-ion chemical ionization mass spectrometry
- NBT Stress Induced Anomalous Drain Current Instability in HfSiON pMOSFETs Arising from Bipolar Charge Trapping
- Floating Body Accelerated Oxide Breakdown Progression in Ultra-Thin Oxide SOI pMOSFETs
- Electrical Characteristics and Preparation of Nanostructured Pb(Zr_Ti_)O_3 Ferroelectric Films by Spray Pyrolysis
- Characterization of Embedded Poly-Heater PMOSFETs and its Application on In-Line Wafer Level NBTI Monitor
- Width Scaling and Layout Variation Effects on Dual Damascene Copper Interconnects Electromigration
- Effects of Base Oxide and Silicon Composition on Charge Trapping in HfSiO/SiO_2 High-k Gate Stacks
- Spatial variability of bulk soil electrical conductivity in a Malaysian paddy field : key to soil management
- Plasma Immersion Ion Implantation for Shallow Junctions and Other Applications
- A Traffic Control Approach for Voice over ATM Networks
- Electropolishing of A Spherical Surface and the Application of Fuzzy Inference
- A Novel Soft-Program for a Narrow Erased State Vt Distribution, Read Disturbance Suppression and Over-Program Annihilation in Multilevel Cell Flash Memories
- Effect of Substrate Orientation on Arsenic Precipitation in Low-Temperature-Grown GaAs
- Optical Gain and Co-Stimulated Emissions of Photons and Phonons in Indirect Bandgap Semiconductors
- The change in settling velocity of inertial particles in cellular flow
- Copper Interconnect Electromigration Behavior in Various Structures and Precise Bimodal Fitting