Temperature Effect on Off-State Drain Leakage Current in a Hot-Carrier Stressed n-MOSFET

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概要

• 論文の詳細を見る
• 1997-09-16

著者

• Chiang L.

  Department Of Electronics Engineering National Chiao-tung University

• ZOUS N.

  Department of Electronics Engineering, National Chiao-Tung University

• WANG Tahui

  Department of Electronics Engineering, National Chiao-Tung University

• CHANG T.

  Department of Electronics Engineering, National Chiao-Tung University

• LIU C.

  Department of Electronics Engineering, National Chiao-Tung University

• Zous N.

  Department Of Electronics Engineering National Chiao-tung University

• Wang Tahui

  Department Of Electronic Engineering National Chiao Tung University

• Liu C.

  Department Of Agricultural Chemistry Nation Taiwan University

• Chang T.

  Department Of Electronics Engineering National Chiao-tung University

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