A Novel Soft-Program for a Narrow Erased State Vt Distribution, Read Disturbance Suppression and Over-Program Annihilation in Multilevel Cell Flash Memories
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概要
- 論文の詳細を見る
In floating gate flash memories, anode hot hole injection induced by the channel FN erase will result in tunnel oxide degradation, severe read disturbance and an abnormally fast program. All of these issues are critical for multilevel cell (MLC) flash memory design, which requires precise threshold voltage placement, good data retentivity and programming controllability. In this paper, a novel soft-program scheme is proposed to narrow the threshold voltage distribution in the first level. Cycling-induced read disturbance and programming inaccuracy are also reduced. This technique is essential for the application of more-than-2-bit MLC flash memories.
- 2003-04-15
著者
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Lu Tao
Silicon Laboratory Macronix International Co. Ltd. Science-based Industrial Park
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Wang Tahui
Department Of Electronic Engineering National Chiao Tung University
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Lu Chih-Yuan
Silicon Laboratory, Macronix International Co., Ltd, Science-Based Industrial Park, Hsin-Chu, Taiwan, ROC
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Lu Tao
Silicon Laboratory, Macronix International Co., Ltd, Science-Based Industrial Park, Hsin-Chu, Taiwan, ROC
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Yeh Chih
Department of Electronics Engineering, National Chiao-Tung University, Hsin-Chu, Taiwan, ROC
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Fan Tso
Silicon Laboratory, Macronix International Co., Ltd, Science-Based Industrial Park, Hsin-Chu, Taiwan, ROC
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Pan Sam
Silicon Laboratory, Macronix International Co., Ltd, Science-Based Industrial Park, Hsin-Chu, Taiwan, ROC
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Wang Tahui
Department of Electronics Engineering, National Chiao-Tung University, Hsin-Chu, Taiwan, ROC
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