Simulation of Positive Oxide Trapped Charge Induced Leakage Current and Read-Disturb in Flash EEPROMs
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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Tsai C.
Department of Computer Science and Engineering, Tatung University
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YEH C.
Department of Electrical Engineering, Texas A&M University, College Station
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Chiang L.
Department Of Electronics Engineering National Chiao-tung University
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ZOUS N.
Department of Electronics Engineering, National Chiao-Tung University
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WANG Tahui
Department of Electronics Engineering, National Chiao-Tung University
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Zous N.
Department Of Electronics Engineering National Chiao-tung University
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Wang Tahui
Department Of Electronic Engineering National Chiao Tung University
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Tsai C.
Department Of Electronics Engineering National Chiao-tung University
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Yeh C.
Department Of Electrical Engineering Texas A&m University College Station
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Tsai C.
Department Of Computer Science And Engineering Tatung University
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