ZOUS N. | Department of Electronics Engineering, National Chiao-Tung University

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概要

• ZOUS N. K.の詳細を見る
• 同名の論文著者
• Department of Electronics Engineering, National Chiao-Tung Universityの論文著者

関連著者

• ZOUS N.

  Department of Electronics Engineering, National Chiao-Tung University

• Zous N.

  Department Of Electronics Engineering National Chiao-tung University

• Chiang L.

  Department Of Electronics Engineering National Chiao-tung University

• WANG Tahui

  Department of Electronics Engineering, National Chiao-Tung University

• Wang Tahui

  Department Of Electronic Engineering National Chiao Tung University

• Tsai C.

  Department of Computer Science and Engineering, Tatung University

• YEH C.

  Department of Electrical Engineering, Texas A&M University, College Station

• HUANG L.

  Department of Electronics Engineering, National Chiao-Tung University

• Tsai C.

  Department Of Electronics Engineering National Chiao-tung University

• Yeh C.

  Department Of Electrical Engineering Texas A&m University College Station

• Tsai C.

  Department Of Computer Science And Engineering Tatung University

• Huang L.

  Department Of Electronics Engineering National Chiao-tung University

• Wang T.

  Department Of Orthopaedic Surgery The Affiliated Hospital Of Medical College Of Qingdao University

• CHANG T.

  Department of Electronics Engineering, National Chiao-Tung University

• LIU C.

  Department of Electronics Engineering, National Chiao-Tung University

• CHAO T.

  National Nano Device Laboratory

• Wang Tahui

  Department Of Electronics Engineering National Chiao-tung University

• Liu C.

  Department Of Agricultural Chemistry Nation Taiwan University

• Yeh C.

  Department Of Electronics Engineering National Chiao-tung University

• Wang T.

  Department Of Chemistry Soochow University

• Chang T.

  Department Of Electronics Engineering National Chiao-tung University

もっと見る 閉じる

著作論文

• Simulation of Positive Oxide Trapped Charge Induced Leakage Current and Read-Disturb in Flash EEPROMs
• Auger Recombination Enhanced Hot Electron Programming in Flash EEPROMs
• Stress Induced Subthreshold Current Hump in Short Gate-Length pMOSFET's with Shallow Trench Isolation
• Temperature Effect on Off-State Drain Leakage Current in a Hot-Carrier Stressed n-MOSFET
• Oxide Thickness Dependence of Hot Carrier Stress Induced Drain Leakage Current Degradation in Thin-Oxide n-MOSFET's

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