Zous N. | Department Of Electronics Engineering National Chiao-tung University
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概要
関連著者
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ZOUS N.
Department of Electronics Engineering, National Chiao-Tung University
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Zous N.
Department Of Electronics Engineering National Chiao-tung University
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Chiang L.
Department Of Electronics Engineering National Chiao-tung University
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WANG Tahui
Department of Electronics Engineering, National Chiao-Tung University
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Wang Tahui
Department Of Electronic Engineering National Chiao Tung University
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Tsai C.
Department of Computer Science and Engineering, Tatung University
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YEH C.
Department of Electrical Engineering, Texas A&M University, College Station
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HUANG L.
Department of Electronics Engineering, National Chiao-Tung University
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Tsai C.
Department Of Electronics Engineering National Chiao-tung University
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Yeh C.
Department Of Electrical Engineering Texas A&m University College Station
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Tsai C.
Department Of Computer Science And Engineering Tatung University
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Huang L.
Department Of Electronics Engineering National Chiao-tung University
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Wang T.
Department Of Orthopaedic Surgery The Affiliated Hospital Of Medical College Of Qingdao University
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CHANG T.
Department of Electronics Engineering, National Chiao-Tung University
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LIU C.
Department of Electronics Engineering, National Chiao-Tung University
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CHAO T.
National Nano Device Laboratory
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Wang Tahui
Department Of Electronics Engineering National Chiao-tung University
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Liu C.
Department Of Agricultural Chemistry Nation Taiwan University
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Yeh C.
Department Of Electronics Engineering National Chiao-tung University
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Wang T.
Department Of Chemistry Soochow University
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Chang T.
Department Of Electronics Engineering National Chiao-tung University
著作論文
- Simulation of Positive Oxide Trapped Charge Induced Leakage Current and Read-Disturb in Flash EEPROMs
- Auger Recombination Enhanced Hot Electron Programming in Flash EEPROMs
- Stress Induced Subthreshold Current Hump in Short Gate-Length pMOSFET's with Shallow Trench Isolation
- Temperature Effect on Off-State Drain Leakage Current in a Hot-Carrier Stressed n-MOSFET
- Oxide Thickness Dependence of Hot Carrier Stress Induced Drain Leakage Current Degradation in Thin-Oxide n-MOSFET's