A Comparative Study of Interface Trap Induced Drain Leakage Current in Various n-MOSFET Structures
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概要
- 論文の詳細を見る
- 1995-08-21
著者
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Chiang L.
Department Of Electronics Engineering National Chiao-tung University
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WANG Tahui
Department of Electronics Engineering, National Chiao-Tung University
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CHANG T.
Department of Electronics Engineering, National Chiao-Tung University
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HUANG C.
Technology Development Dept., Macronix International Co.
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Wang Tahui
Department Of Electronic Engineering National Chiao Tung University
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Chang T.
Department Of Electronics Engineering National Chiao-tung University
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