Subwavelength-Resolution Raman Microscopy of Si Structures Using Metal-Particle-Topped AFM Probe
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2005-02-10
著者
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Tada Tetsuya
Mirai Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Scienc
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Kanayama Toshihiko
Mirai Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Scienc
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Kanayama Toshihiko
National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn
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POBORCHII Vladimir
MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and
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