Detector pixel in dielectric bolometer mode based on ferroelectric thin film capacitors for uncooled infrared image sensor

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Strained SrTiO_3/ BaTiO_3 Superlattices Formed by Laser Ablation Technique and Their High Dielectric Properties
Preparation of BST Ferroelectric Thin Film by Metal Organic Decomposition for Infrared Sensor
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Detector pixel in dielectric bolometer mode based on ferroelectric thin film capacitors for uncooled infrared image sensor
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Preparation of PbTiO_3 Thin Films by an Excimer Laser Ablation Technique with Second Laser Irradiation
Investigation of Grain-Size Influence on the Ferroelectric-to-Paraelectric Phase Transition in BaTiO_3 Ceramics by Means of AC Calorimetry
Simulation of Switching Properties of Ferroelectrics on the Basis of Dipole Lattice Model
Grain Size Dependence of Switching Properties of Ferroelectric BaTiO_3 Ceramics
Enhancement of Field-Excited Electron Emission from Lead-Zirconate-Titanate Ceramic Using Ultrathin Metal Electrode
Oxygen and Fluorine Treatment Effect on Silicon Surface Characterized by Infrared Reflection Absorption Spectroscopy
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Electron Emission from PZT Ceramic by External Pulsed Electric Fields : Pulse Voltage Dependence of Emitted Charge
Preparation of PbTiO_3 Thin Film on Si by ArF Excimer Baser Ablation
Electron Emission into Vacuum from Lead-Zirconate-Titanate Ferroelectric Ceramics Induced by Polarization Reversal
In-Situ Characterization of Si Surface Oxidation by High-Sensitivity Infrared Reflection Spectroscopic Method
Field-Excited Electron Emission from Ferroelectric Ceramic in Vacuum
High-Sensitivity Infrared Characterization of Ultrathin SiO_2 Film by Grazing Internal Reflection Method
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Characterization of F_2 Treatment Effects on Si(100) Surface and Si(100)/SiO_3 Interface
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Theoretical Analysis of Hydrogen-Related Defects in SiO_2 Thin Film by Molecular Orbital Method
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Characterization of Charged Traps near Si-SiO_2 Interface in Photo-CVD SiO_2 Film
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Preparation of SrBi_2Ta_2O_9 Films by Laser Ablation Method
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Theoretical Analysis of Oxygen-Excess Defects in SiO_2 Thin Film by Molecular Orbital Method
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Buckling Control of Silicon Dioxide Diaphragms for Sensitivity Enhancement of Piezoelectric Ultrasonic Microsensors
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