Sakashita Mitsuo | Graduate School of Eng., Nagoya Univ.
スポンサーリンク
概要
関連著者
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Sakashita Mitsuo
Graduate School of Eng., Nagoya Univ.
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Zaima Shigeaki
Graduate School Of Eng. Nagoya Univ.
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SAKAI Akira
Graduate School of Engineering, Nagoya University
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Sakai Akira
Graduate School of Engineering Science, Osaka University, 1-3 Machikane-cho, Toyonaka, Osaka 560-8531, Japan
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Sakai Akira
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, Osaka 560-8531, Japan
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SAKASHITA Mitsuo
Graduate School of Engineering, Nagoya University
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Zaima S
Nagoya Univ. Nagoya Jpn
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Sakashita M
Graduate School Of Engineering Nagoya University
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酒井 彰
室蘭工大工
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Sakai A
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
著作論文
- Pr-Oxide-Based Dielectric Films on Ge Substrates
- Behavior of Local Charge Trapping Sites in La_2O_3-Al_2O_3 Composite Films under Constant Voltage Stress
- Local Current Leakage Characterization in La_2O_3-Al_2O_3 Composite Films by Conductive Atomic Force Microscopy
- Nanoscale Observations for Degradation Phenomena in SiO_2 and High-k Gate Insulators Using Conductive-Atomic Force Microscopy
- Crystalline and electrical properties of mictamict TiSiN gate MOS capacitors
- Film structures and electrical properties of Pr silicate formed by pulsed laser deposition
- Thermal Stability and Electrical Properties of (La_2O_3)_(Al_2O_3)_x Composite Films
- Control of interfacial properties of Al2O3/Ge gate stack structure using radical nitridation technique (Special issue: Dielectric thin films for future electron devices: science and technology)
- Evaluation of Light Induced Damages in Plasma Process on Electrical Properties of Al_2O_3/Ge Gate Stack Structure
- Thermal Stability and Scalability of Mictamict Ti–Si–N Metal–Oxide–Semiconductor Gate Electrodes