MANABE Kenzo | System Devices Research Laboratories, NEC Corporation

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概要

• MANABE Kenzoの詳細を見る
• 同名の論文著者
• System Devices Research Laboratories, NEC Corporationの論文著者

関連著者

• MANABE Kenzo

  System Devices Research Laboratories, NEC Corporation

• TATSUMI Toru

  System Devices Research Laboratories, NEC Corporation

• Yoshihara Takuya

  System Devices Research Laboratories Nec Corporation

• Manabe Katsuya

  System Devices Research Laboratories Nec Corporation

• Manabe Kenzo

  System Devices Research Laboratories Nec Corporation

• WATANABE Heiji

  System Devices Research Laboratories, NEC Corporation

• Watanabe Heiji

  System Devices Research Laboratories Nec Corporation

• TAKAHASHI Kensuke

  System Devices Research Laboratories, NEC Corporation

• MORIOKA Ayuka

  System Devices Research Laboratories, NEC Corporation

• IKARASHI Taeko

  System Devices Research Laboratories, NEC Corp.

• Tatsumi Toru

  System Devices Research Laboratories Nec Corporation

• Morioka Ayuka

  System Devices Research Laboratories Nec Corporation

• Takahashi Kensuke

  System Devices Research Laboratories Nec Corporation

• Tatsumi Toru

  System Devices And Fundamental Research Nec Corporation

• Watanabe Hirohito

  System Devices Research Laboratories Nec Corp.

• IKARASHI Nobuyuki

  System Devices Research Laboratories, NEC Corporation

• Ikarashi Taeko

  System Devices Research Laboratories Nec Corporation

• Oshida Makiko

  System Devices Research Laboratories Nec Corporation

• Ikarashi N

  Nec Corporation Device Platforms Research Laboratories

• Ikarashi Nobuyuki

  System Devices Research Laboratories Nec Corporation

• Miura Yoshinao

  System Devices Research Laboratories Nec Corporation

• WAKABAYASHI Hitoshi

  System Devices and Fundamental Research, NEC Corporation

• Tanaka Masayasu

  System Devices Research Laboratories Nec Corporation

• HASE Takashi

  System Devices Research Laboratories, NEC Corporation

• TERASHIMA Koichi

  System Devices Research Laboratories, NEC Corporation

• OSHIDA Makiko

  R&D Support Center, NEC Corporation

• Wakabayashi Hitoshi

  System Devices Research Laboratories Nec Corporation

• Wakabayashi Hitoshi

  System Devices And Fundamental Research Nec Corporation

• IKARASHI Nobuyuki

  NEC Corporation, Device Platforms Research Laboratories

• Terashima Koichi

  System Devices Research Laboratories Nec Corporation

• YASUTAKE Kiyoshi

  Department of Precision Engineering, Faculty of Engineering, Osaka University

• WATANABE Heiji

  Department of Precision Science and Technology, Osaka University

• WATANABE Hirohito

  System Devices Research Laboratories, NEC Corporation

• OSHIDA Makiko

  System Devices Research Laboratories, NEC Corporation

• Hase Takashi

  System Devices Research Laboratories Nec Corporation

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著作論文

• High-Mobility Dual Metal Gate MOS Transistors with High-k Gate Dielectrics
• Fully Silicided NiSi Gate Electrodes on HfSiON Gate Dielectrics for Low-Power Applications
• High Mobility Dual Metal Gate MOS Transistors with High-k Gate Dielectrics
• Fully Silicided NiSi Gates on HfSiON Gate Dielectrics for Low Power Application
• Mechanism of Suppressed Change in Effective Work Functions for Impurity-Doped Fully Silicided NiSi Electrodes on Hf-Based Gate Dielectrics
• Analysis of the Origin of the Threshold Voltage Change Induced by Impurity in Fully Silicided NiSi/SiO_2 gate stacks
• Formation of Nickel Self-Aligned Silicide by Using Cyclic Deposition Method
• Formation of Nickel Self-Aligned Silicide by Using Cyclic Deposition Method

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