Ooishi Tsukasa | Ulsi Laboratory Mitsubishi Electric Corporation

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著作論文

A Board Level Parallel Test Circuit and a Short Circuit Failure Repair Circuit for High-Density, Low-Power DRAMs (Special Issue on Circuit Technologies for Memory and Analog LSIs)
A Line-Mode Test with Data Register for ULSI Memory Architecture (Special Issue on LSI Memories)
An Automatic Temperature Compensation of Internal Sense Ground for Subquarter Micron DRAM's(Special Issue on the 1994 VLSI Circuits Symposium)
A Well-Synchronized Sensing/Equalizing Method for Sub-1.0-V Operating Advanced DRAM's (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994))

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