Fang Yean-kuen | Institute Of Microelectronics National Cheng Kung University

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概要

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著作論文

Efficient Improvement on Device Performance for sub-90nm CMOSFETs
An Efficient Mobility Enhancement Engineering on 65nm FUSI CMOSFETs using a Second CESL Process
Systematic Analysis and Modeling of On-Chip Spiral Inductors for CMOS RFIC Application
Mobility Modulation Technology Impact on Device Performance and Reliability for sub-90nm SOI CMOSFETs
The Impact of Body-Potential on Hot-Carrier-Induced Device Degradation for 90nm Partially-Depleted SOI nMOSFETs
Width Effect on Hot-Carrier-Induced Degradation for 90nm Partially Depleted SOI CMOSFETs
Width Effect on Hot-Carrier-induced Degradation for 90nm Partially Depleted SOI CMOSFET
The Impact of Pad Test-Fixture for De-embedding on Radio-Frequency MOSFETs
Impacts of Layout Dimensions and Ambient Temperatures on Silicon Based On-Chip RF Interconnects
Efficient Mobility Enhancement Engineering on 65 nm Fully Silicide Complementary Metal–Oxide–Semiconductor Field-Effect-Transistors Using Second Contect Etch Stop Layer Process
Narrow Width and Length Dependence of SiGe and Sallow-Trench-Isolation Stress Induced Defects in 45 nm p-Type Metal–Oxide–Semiconductor Field-Effect Transistors with Strained SiGe Source/Drain
Stress Technology Impact on Device Performances and Reliability for $\langle100\rangle$ Sub-90 nm Silicon-on-Insulator Complementary Metal–Oxide–Semiconductor Field-Effect-Transistors
Width Effect on Hot-Carrier-Induced Degradation for 90 nm Partially Depleted SOI CMOSFETs

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