Pan Shing-tai | Department Of Computer Science And Information Engineering Shu-te University
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関連著者
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Pan Shing-tai
Department Of Computer Science And Information Engineering Shu-te University
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Lai Chieh-ming
Institute Of Microelectronics National Cheng Kung University
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Fang Yean-kuen
Institute Of Microelectronics National Cheng Kung University
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Yeh Wen-kuan
Department Of Electrical Engineering National University Of Kaohsiung
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CHEN Ching-Fa
Department of Electrical Engineering, National Sun Yat-Sen University
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HSIEH Jer-Guang
Department of Electrical Engineering, National Sun Yat-Sen University
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Chen Ching-fa
Department Of Electrical Engineering National Sun Yat-sen University:department Of Electronic Engine
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Hsieh Jer-guang
Department Of Electrical Engineering National Sun Yat-sen University
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YEH Wen-Kuan
Department of Electrical Engineering, National University of Kaohsiung
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PAN Shing-Tai
Department of Computer Science Information Engineering, Shu-Te University
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HU Chia-Che
Department of Computer Science Information Engineering, Shu-Te University
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KU Chao-Ching
Institute of Microelectronics, National Cheng Kung University
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CHEN Shuo-Mao
Institute of Microelectronics, National Cheng Kung University
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FANG Yean-Kuan
Institute of Microelectronics, National Cheng Kung University
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CHAO J.
Taiwan Semiconductor Manufacturing Company
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Hu Chia-che
Department Of Electrical Engineering National University Of Kaohsiung
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Chen Shuo-mao
Institute Of Microelectronics National Cheng Kung University
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Pan Shing-tai
Department Of Computer Science Information Engineering Shu-te University
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Ku Chao-ching
Institute Of Microelectronics National Cheng Kung University
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Hsu Chia-wei
Department Of Electrical Engineering National University Of Kaohsiung
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Hu Chia-che
Department Of Computer Science Information Engineering Shu-te University
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Fang Yean-kuan
Institute Of Microelectronics National Cheng Kung University
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Chen C‐f
National Sun Yat‐sen Univ. Kaohsiung Twn
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CHEN ChingFa
Department of Electrical Engineering, National Sun Yat-Sen University
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PAN ShingTai
Department of Computer Science and Information Engineering, Shu-Te University
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HSIEH JerGuang
Department of Electrical Engineering, National Sun Yat-Sen University
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Pan S‐t
Shu‐te Univ. Kaohsiung Twn
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Hsieh Jerguang
Department Of Electrical Engineering National Sun Yat-sen University
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Lai Chieh-Ming
Institute of Microelectronics, National Cheng Kung University, No. 1 University Road, Tainan, Taiwan 70101, R.O.C.
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Pan Shing-Tai
Department of Computer Science Information Engineering, Shu-Te University, Shu Te University No. 59, Hun Shang Rd, Hun Shang Village, Yen Chao, Kaohsiung 82442, Taiwan, R.O.C.
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Fang Yean-Kuen
Institute of Microelectronics, National Cheng Kung University, No. 1 University Road, Tainan, Taiwan 70101, R.O.C.
著作論文
- The Impact of Pad Test-Fixture for De-embedding on Radio-Frequency MOSFETs
- D-Stability Analysis for a Class of Uncertain Discrete Systems with Multiple Time Delays
- Robust Stability for a Class of Uncertain Singularly Perturbed Systems with Multiple Time Delays
- Width Effect on Hot-Carrier-Induced Degradation for 90 nm Partially Depleted SOI CMOSFETs