Lai Chieh-ming | Institute Of Microelectronics National Cheng Kung University
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概要
関連著者
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Lai Chieh-ming
Institute Of Microelectronics National Cheng Kung University
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Fang Yean-kuen
Institute Of Microelectronics National Cheng Kung University
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Yeh Wen-kuan
Department Of Electrical Engineering National University Of Kaohsiung
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YEH Wen-Kuan
Department of Electrical Engineering, National University of Kaohsiung
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FANG Yean-Kuan
Institute of Microelectronics, National Cheng Kung University
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Fang Yean-kuan
Institute Of Microelectronics National Cheng Kung University
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LIN Chien-Ting
Institute of Microelectronics, National Cheng Kung University
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Fang Yean-kuen
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
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Hu Chia-che
Department Of Electrical Engineering National University Of Kaohsiung
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Hsu Chia-wei
Department Of Electrical Engineering National University Of Kaohsiung
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HSU Chia-Wei
Department of Electrical Engineering, National University of Kaohsiung
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HSU Che-Hua
United Microelectronics Corporation, Central R&D Division
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CHEN Liang-Wei
United Microelectronics Corporation, Central R&D Division
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MA Mike
United Microelectronics Corporation, Central R&D Division
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SHIAU W.
United Microelectronics Corporation, Central R&D Division
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PAN Shing-Tai
Department of Computer Science Information Engineering, Shu-Te University
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HU Chia-Che
Department of Computer Science Information Engineering, Shu-Te University
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Ma Mike
United Microelectronics Corporation Central R&d Division
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Shiau W.
United Microelectronics Corporation Central R&d Division
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Chen Liang-wei
United Microelectronics Corporation Central R&d Division
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Pan Shing-tai
Department Of Computer Science And Information Engineering Shu-te University
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Hu Chia-che
Department Of Computer Science Information Engineering Shu-te University
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Shiau W.
United Microelectronics Corporation (umc) Central R&d Division
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Syu Jia-wei
Department Of Electrical Engineering National University Of Kaohsiung
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TANG Mao-Chyuan
Institute of Microelectronics, National Cheng Kung University
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YEH Ta-Hsun
Realtek Semiconductor Corporation
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KU Chao-Ching
Institute of Microelectronics, National Cheng Kung University
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CHEN Shuo-Mao
Institute of Microelectronics, National Cheng Kung University
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CHAO J.
Taiwan Semiconductor Manufacturing Company
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Chen Shuo-mao
Institute Of Microelectronics National Cheng Kung University
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Pan Shing-tai
Department Of Computer Science Information Engineering Shu-te University
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Ku Chao-ching
Institute Of Microelectronics National Cheng Kung University
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Tang Mao-chyuan
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
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Lai Chieh-Ming
Institute of Microelectronics, National Cheng Kung University, No. 1 University Road, Tainan 70101, Taiwan, R. O. C.
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Lai Chieh-Ming
Institute of Microelectronics, National Cheng Kung University, No. 1 University Road, Tainan, Taiwan 70101, R.O.C.
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Lin Chien-Ting
Institute of Microelectronics, National Cheng Kung University, No. 1 University Road, Tainan 70101, Taiwan, R. O. C.
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Yeh Wen-Kuan
Department of Electrical Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Road., Nan-Tzu Dist., Kaohsiung 811, Taiwan, R.O.C.
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Pan Shing-Tai
Department of Computer Science Information Engineering, Shu-Te University, Shu Te University No. 59, Hun Shang Rd, Hun Shang Village, Yen Chao, Kaohsiung 82442, Taiwan, R.O.C.
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Fang Yean-Kuen
Institute of Microelectronics, National Cheng Kung University, No. 1 University Road, Tainan 70101, Taiwan, R.O.C.
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Fang Yean-Kuen
Institute of Microelectronics, National Cheng Kung University, No. 1 University Road, Tainan 70101, Taiwan, R. O. C.
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Fang Yean-Kuen
Institute of Microelectronics, National Cheng Kung University, No. 1 University Road, Tainan, Taiwan 70101, R.O.C.
著作論文
- Efficient Improvement on Device Performance for sub-90nm CMOSFETs
- An Efficient Mobility Enhancement Engineering on 65nm FUSI CMOSFETs using a Second CESL Process
- Stress Technology Impact on Device Performances and Reliability for Sub-90nm Silicon-on-Insulator Complementary Metal-Oxide-Semiconductor Field-Effect-Transistors (Special Issue: Solid State Devices & Materials)
- Systematic Analysis and Modeling of On-Chip Spiral Inductors for CMOS RFIC Application
- Mobility Modulation Technology Impact on Device Performance and Reliability for sub-90nm SOI CMOSFETs
- The Impact of Body-Potential on Hot-Carrier-Induced Device Degradation for 90nm Partially-Depleted SOI nMOSFETs
- Width Effect on Hot-Carrier-Induced Degradation for 90nm Partially Depleted SOI CMOSFETs
- Width Effect on Hot-Carrier-induced Degradation for 90nm Partially Depleted SOI CMOSFET
- The Impact of Pad Test-Fixture for De-embedding on Radio-Frequency MOSFETs
- Extra bonus on transistor optimization with stress enhanced notched-gate technology for sub-90nm complementary metal oxide semiconductor field effect transistor (Special issue: Solid state devices and materials)
- Efficient mobility enhancement engineering on 65nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process (Special issue: Solid state devices and materials)
- Investigation and Modeling of Stress Interactions on 90nm Silicon on Insulator Complementary Metal Oxide Semiconductor by Various Mobility Enhancement Approaches (Special Issue: Solid State Devices & Materials)
- Efficient Mobility Enhancement Engineering on 65 nm Fully Silicide Complementary Metal–Oxide–Semiconductor Field-Effect-Transistors Using Second Contect Etch Stop Layer Process
- Stress Technology Impact on Device Performances and Reliability for $\langle100\rangle$ Sub-90 nm Silicon-on-Insulator Complementary Metal–Oxide–Semiconductor Field-Effect-Transistors
- Width Effect on Hot-Carrier-Induced Degradation for 90 nm Partially Depleted SOI CMOSFETs