SHIAU W. | United Microelectronics Corporation, Central R&D Division
スポンサーリンク
概要
関連著者
-
Lai Chieh-ming
Institute Of Microelectronics National Cheng Kung University
-
Fang Yean-kuen
Institute Of Microelectronics National Cheng Kung University
-
LIN Chien-Ting
Institute of Microelectronics, National Cheng Kung University
-
YEH Wen-Kuan
Department of Electrical Engineering, National University of Kaohsiung
-
SHIAU W.
United Microelectronics Corporation, Central R&D Division
-
FANG Yean-Kuan
Institute of Microelectronics, National Cheng Kung University
-
Yeh Wen-kuan
Department Of Electrical Engineering National University Of Kaohsiung
-
Shiau W.
United Microelectronics Corporation Central R&d Division
-
Fang Yean-kuan
Institute Of Microelectronics National Cheng Kung University
-
Fang Yean-kuen
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
-
Shiau W.
United Microelectronics Corporation (umc) Central R&d Division
-
Syu Jia-wei
Department Of Electrical Engineering National University Of Kaohsiung
著作論文
- Mobility Modulation Technology Impact on Device Performance and Reliability for sub-90nm SOI CMOSFETs
- The Impact of Body-Potential on Hot-Carrier-Induced Device Degradation for 90nm Partially-Depleted SOI nMOSFETs