WANG Ruey-Lue | Department of Electrical Engineering, National Cheng Kung University
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概要
関連著者
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WANG Ruey-Lue
Department of Electrical Engineering, National Cheng Kung University
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Su Yan-kuin
Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
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FANG Yean-Kuen
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, Nat
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Su Yan-kuin
Department Of Electrical Engineering National Cheng-kung University
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Chang Chun-yen
Institute Of Electronics National Chiao Tung University
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Fang Yean-kuen
Institute Of Microelectronics National Cheng Kung University
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Fang Yean-kuen
Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
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YEH Wen-Kuan
Department of Electrical Engineering, National University of Kaohsiung
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TANG Mao-Chyuan
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, Nat
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Yeh Wen-kuan
Department Of Electrical Engineering National University Of Kaohsiung
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Wang R‐l
Ku Shan Univ. Technol. Tainan Hsien Twn
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Wei Sun-chin
Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
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Chang Chun-yen
Institute Of Electronics National Chiao Tang University:national Nano-device Laboratories
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YARN Kao-Feng
Department of Electrical Engineering, National Cheng Kung University
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WANG Yeong-Her
Department of Electrical Engineering, National Cheng Kung University
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Yarn Kao-feng
Optoelectronic Semiconductor Center Department Of Electrical Engineering
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Wang Yeong-her
Department Of Electrical Engineering National Cheng Kung University
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Tang Mao-chyuan
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
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Wang Ruey-lue
Department Of Electronic Engineering Ku Shan University Of Technology
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Wang Ruey-lue
Department Of Microelectronic Engineering National Kaohsiung Marine University
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Fang Yean-kuen
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
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Su Yan-kuin
Institute Of Electro-optical Science And Engineering Advance Optoelectronics Technology Center Natio
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Hsueh Ting-Jen
National Nano Device Laboratories, Tainan 741, Taiwan
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Chih-Ho To
National Chip Implementation Center (CIC), National Applied Research Laboratories, 7F, No. 26, Prosperity Rd. 1, Science Park, Hsinchu 300, Taiwan, R.O.C.
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Liu Chien-Hsuan
Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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Ying-Zong Juang
National Chip Implementation Center (CIC), National Applied Research Laboratories, 7F, No. 26, Prosperity Rd. 1, Science Park, Hsinchu 300, Taiwan, R.O.C.
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Chien-Hsuan Liu
Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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Yan-Kuin Su
Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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Lin Yu-Ru
Department of Electronic Engineering, National Kaohsiung Normal University, Kaohsiung 824, Taiwan
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Chen Chao-Jung
Institute of Microelectronics, National Cheng Kung University, Tainan 701, Taiwan
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Liu Pin-Yi
Department of Electronic Engineering, National Kaohsiung Normal University, Kaohsiung 824, Taiwan
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Hsueh Ting-Jen
National Nano Device Labs, National Applied Research Laboratories, Tainan 701, Taiwan
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Wang Ruey-Lue
Department of Electronic Engineering, National Kaohsiung Normal University, Kaohsiung 824, Taiwan
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Su Yan-Kuin
Institute of Microelectronics, National Cheng Kung University, Tainan 701, Taiwan
著作論文
- Molecular Beam Epitaxy Grown GaAs Bipolar-Unipolar Transition Negative Differential Resistance Power Transistor
- Stability of Measurement of Heterojunction Bipolar Transistors Current-Voltage Characteristics with Thermal Effect : Semiconductors
- Impacts of Layout Dimensions and Ambient Temperatures on Silicon Based On-Chip RF Interconnects
- The Layout Geometry and Power-Level Dependences of Degradation in Complementary Metal–Oxide–Semiconductor RF Power Cells from Hot-Carrier Stress with Load Pull System
- Radio-Frequency Inductors on High-Resistivity Silicon Substrates with a Nanocrystalline Silicon Passivation Layer